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834 Results Found

  • Article
  • Open Access
14 Citations
3,687 Views
10 Pages

27 March 2020

Thin-film transistor (TFT) devices composed of metal oxide semiconductors have attracted tremendous research attention globally in recent years. Owing to their ability to offer mobility, metal oxide semiconductor materials can enable high-performance...

  • Article
  • Open Access
14 Citations
3,069 Views
15 Pages

27 September 2022

In this work, three-dimensional modeling of the surface potential along the cylindrical surrounding double-gate (CSDG) MOSFET is proposed. The derived surface potential is used to predict the values of electron mobility along the length of the device...

(This article belongs to the Special Issue Two-Dimensional Semiconductor Nanomaterials and Nanodevices)
  • Article
  • Open Access
2 Citations
3,690 Views
12 Pages

13 February 2023

An analytical surface-potential-based drain current model for amorphous indium–gallium–zinc–oxide (a-InGaZnO) thin film transistors (TFTs) is proposed by introducing an effective charge density approach in this paper. This approach gives two initial...

(This article belongs to the Section Corrosion, Wear and Erosion)
  • Article
  • Open Access
22 Citations
6,895 Views
11 Pages

5 April 2018

In this study, the initial electrical properties, positive gate bias stress (PBS), and drain current stress (DCS)-induced instabilities of amorphous indium gallium zinc oxide (a-IGZO) thin-film transistors (TFTs) with various active layer thicknesses...

(This article belongs to the Section Thin Films and Interfaces)
  • Brief Report
  • Open Access
4 Citations
5,199 Views
8 Pages

The transconductance-to-drain-current method is a transistor sizing methodology that is commonly used in CMOS technology. In this study, we explored by means of simulations, a case of study and three figures of merit used for the method, and we concl...

  • Article
  • Open Access
4 Citations
6,742 Views
11 Pages

30 August 2016

This paper reports a detailed analysis of the drain current modulation of a single-drain normal-gate n channel metal-oxide semiconductor field effect transistor (n-MOSFET) under an on-chip magnetic field. A single-drain n-MOSFET has been fabricated a...

(This article belongs to the Section Physical Sensors)
  • Article
  • Open Access
5 Citations
9,753 Views
11 Pages

20 August 2018

Polycrystalline silicon (poly-Si) thin film transistors (TFT) with a tri-gate fin-like structure and wide drain were designed and simulated to improve gate-induced drain leakage (GIDL), ON-state current, and breakdown voltage. The GIDL of fin-like TF...

(This article belongs to the Special Issue Selected Papers from the 2017 International Conference on Inventions)
  • Article
  • Open Access
6 Citations
4,970 Views
11 Pages

A Simple Drain Current Model for MOS Transistors with the Lorentz Force Effect

  • Hwang-Cherng Chow,
  • Prasenjit Chatterjee and
  • Wu-Shiung Feng

24 May 2017

A novel concept of drain current modelling in rectangular normal MOS transistors with the Lorentz force has been proposed for the first time. The single-drain MOS transistor is qualified as a magnetic sensor. To create the Lorentz force, a DC loop cu...

(This article belongs to the Section Physical Sensors)
  • Article
  • Open Access
4 Citations
3,689 Views
12 Pages

Analytical Drain Current Model for a-SiGe:H Thin Film Transistors Considering Density of States

  • Silvestre Salas-Rodríguez,
  • Francisco López-Huerta,
  • Agustín L. Herrera-May,
  • Joel Molina-Reyes and
  • Jaime Martínez-Castillo

Thin film transistors (TFTs) fabricated on flexible and large area substrates have been studied with great interest due to their future applications. Recent studies have developed new semiconductors such as a-SiGe:H for fabrication of high performanc...

(This article belongs to the Special Issue New CMOS Devices and Their Applications)
  • Article
  • Open Access
5 Citations
10,405 Views
9 Pages

Effect of Ge Concentration on the On-Current Boosting of Logic P-Type MOSFET with Sigma-Shaped Source/Drain

  • Eunjung Ko,
  • Juhee Lee,
  • Seung-Wook Ryu,
  • Hyunsu Shin and ,
  • Seran Park and
  • Dae-Hong Ko
  • + 1 author+ 0 author

Silicon german ium (SiGe) has attracted significant attention for applications in the source/drain (S/D) regions of p-type metal-oxide-semiconductor field-effect transistors (p-MOSFETs). However, in SiGe, as the Ge concentration increases, high-densi...

(This article belongs to the Special Issue Coatings and Thin Film for Chemical Vapor Deposition (CVD) Application)
  • Article
  • Open Access
6 Citations
3,813 Views
17 Pages

Internships with Portuguese Speakers: Leadership, Organisational Culture and the Current Brain Drain

  • Matilde Macedo,
  • Manuel Au-Yong-Oliveira,
  • Cicero Eduardo Walter and
  • Ana Moreira

29 August 2022

Doing internships is increasingly common in Portugal, often being regarded as a prerequisite for entering the labour market. This trend reinforces the need to understand the interns’ perception of the ideal characteristics for this type of expe...

(This article belongs to the Special Issue Understanding Sustainable Human Resource Management)
  • Article
  • Open Access
1,355 Views
11 Pages

Channel Temperature Measurement of GaN HEMT Used in Kilowatt-Level Power Amplifier

  • Sheng Zhong,
  • Wenrao Fang,
  • Juan Zhao,
  • Wenhua Huang and ,
  • Chao Fu,
  • Lulu Wang and
  • Tianwei He
  • + 2 authors+ 0 author

29 September 2025

This paper presents an electrical thermometry method designed for kilowatt(kW)-level Gallium Nitride (GaN) High Electron Mobility Transistors (HEMTs). The dependence of the drain current on the channel temperature in GaN HEMTs is utilized as a means...

  • Article
  • Open Access
9 Citations
11,400 Views
9 Pages

LTPS TFTs with an Amorphous Silicon Buffer Layer and Source/Drain Extension

  • Hye In Kim,
  • Jung Min Sung,
  • Hyung Uk Cho,
  • Yong Jo Kim and ,
  • Young Gwan Park and
  • Woo Young Choi
  • + 1 author+ 0 author

A low leakage poly-Si thin film transistor (TFT) is proposed featuring hydrogenated amorphous silicon (a-Si:H) buffer layer and source/drain extension (SDE) by using technology computer aided design (TCAD) simulation. This architecture reduces off-cu...

(This article belongs to the Special Issue Reliability Assessment and Modeling of Optical and Semiconductor Devices)
  • Article
  • Open Access
1 Citations
850 Views
22 Pages

Sub-harmonic oscillations are a key stability concern in fast-switched inductor power supplies using clocked constant-period peak/valley-current loops. Using generalized models, IC designers can predict and suppress sub-harmonic oscillations with min...

(This article belongs to the Special Issue Advanced Power Electronic Converters for Modern Energy Systems: Architectures, Components, Controllers and Materials)
  • Article
  • Open Access
8 Citations
8,556 Views
15 Pages

Hot Carrier Stress Sensing Bulk Current for 28 nm Stacked High-k nMOSFETs

  • Chii-Wen Chen,
  • Mu-Chun Wang,
  • Cheng-Hsun-Tony Chang,
  • Wei-Lun Chu and ,
  • Shun-Ping Sung and
  • Wen-How Lan
  • + 1 author+ 0 author

8 December 2020

This work primarily focuses on the degradation degree of bulk current (IB) for 28 nm stacked high-k (HK) n-channel metal–oxide–semiconductor field-effect transistors (MOSFETs), sensed and stressed with the channel-hot-carrier test and the...

(This article belongs to the Special Issue Application of Electronic Devices on Intelligent System)
  • Article
  • Open Access
4 Citations
4,784 Views
15 Pages

A Cross-Scale Electrothermal Co-Simulation Approach for Power MOSFETs at Device–Package–Heatsink–Board Levels

  • Yuxuan Dai,
  • Jiafei Yao,
  • Jing Chen,
  • Qingyou Qian and ,
  • Maolin Zhang,
  • Jun Zhang,
  • Qing Yao,
  • Chenyang Huang,
  • Mingshun Sun and
  • Yufeng Guo
  • + 5 authors+ 0 author

31 October 2024

This paper proposes a cross-scale simulation approach for evaluating the steady-state electrothermal performance of power MOSFETs at the device–package–heatsink–board (DPHB) level. A co-simulation framework is designed by employing...

(This article belongs to the Section D1: Semiconductor Devices)
  • Article
  • Open Access
25 Citations
4,366 Views
10 Pages

Design and Investigation of the Junction-Less TFET with Ge/Si0.3Ge0.7/Si Heterojunction and Heterogeneous Gate Dielectric

  • Tao Han,
  • Hongxia Liu,
  • Shulong Wang,
  • Shupeng Chen and ,
  • Wei Li,
  • Xiaoli Yang,
  • Ming Cai and
  • Kun Yang
  • + 3 authors+ 0 author

To improve the on-state current and reduce the miller capacitance of the conventional junction-less tunneling field effect transistor (JLTFET), the junction-less TFET with Ge/Si0.3Ge0.7/Si heterojunction and heterogeneous gate dielectric (H-JLTFET) i...

(This article belongs to the Section Semiconductor Devices)
  • Article
  • Open Access
7 Citations
3,831 Views
8 Pages

18 October 2021

A single unified analytical model is presented to predict the shot noise for both the source-to-drain (SD) and the gate tunneling current in sub-10 nm MOSFETs with ultrathin oxide. Based on the Landauer formula, the model is constructed from the sequ...

(This article belongs to the Special Issue Transport and Noise Behavior of Nanoelectronic Devices)
  • Article
  • Open Access
4 Citations
5,531 Views
7 Pages

A Low Impact Ionization Rate Poly-Si TFT with a Current and Electric Field Split Design

  • Feng-Tso Chien,
  • Kuang-Po Hsueh,
  • Zhen-Jie Hong,
  • Kuan-Ting Lin and ,
  • Yao-Tsung Tsai and
  • Hsien-Chin Chiu
  • + 1 author+ 0 author

13 August 2019

In this study, a novel low impact ionization rate (low-IIR) poly-Si thin film transistor featuring a current and electric field split (CES) structure with bottom field plate (BFP) and partial thicker channel raised source/drain (RSD) designs is propo...

(This article belongs to the Special Issue Semiconductor Thin Films)
  • Article
  • Open Access
1,457 Views
13 Pages

9 September 2025

In this study, the nonlinearity characteristics of bilayer graphene field-effect transistors (Bi-GFETs) are analyzed by using a small-signal equivalent circuit. The static nonlinearity is determined by applying mathematical operation on the drain cur...

(This article belongs to the Special Issue Wide-Bandgap Semiconductor Devices: Materials, Fabrication, and Applications, 2nd Edition)
  • Article
  • Open Access
4 Citations
3,218 Views
11 Pages

Prediction of Single-Event Effects in FDSOI Devices Based on Deep Learning

  • Rong Zhao,
  • Shulong Wang,
  • Shougang Du,
  • Jinbin Pan and ,
  • Lan Ma,
  • Shupeng Chen,
  • Hongxia Liu and
  • Yilei Chen
  • + 3 authors+ 0 author

21 February 2023

Single-event effects (SEE) are an important index of radiation resistance for fully depleted silicon on insulator (FDSOI) devices. The research into traditional FDSOI devices is based on simulation software, which is time consuming, requires a large...

  • Article
  • Open Access
27 Citations
4,941 Views
10 Pages

Demonstration of Fin-Tunnel Field-Effect Transistor with Elevated Drain

  • Jang Hyun Kim,
  • Hyun Woo Kim,
  • Garam Kim,
  • Sangwan Kim and
  • Byung-Gook Park

7 January 2019

In this paper, a novel tunnel field-effect transistor (TFET) has been demonstrated. The proposed TFET features a SiGe channel, a fin structure and an elevated drain to improve its electrical performance. As a result, it shows high-level ON-state curr...

(This article belongs to the Special Issue Extremely-Low-Power Devices and Their Applications)
  • Article
  • Open Access
10 Citations
7,686 Views
13 Pages

17 March 2020

The device structure of DLTFET is optimized by the Silvaco TCAD software to solve the problems of lower on-state current and larger miller capacitance of traditional doping-less tunneling field effect transistors (DLTFETs), and the performance can be...

(This article belongs to the Section High-Energy Beam Surface Engineering and Coatings)
  • Article
  • Open Access
1,064 Views
22 Pages

Low-refresh-rate driving is an effective way to reduce the power consumption of active-matrix organic light-emitting diode (AMOLED) displays. However, in conventional low-temperature polycrystalline silicon (LTPS) thin-film transistor (TFT) pixel cir...

  • Article
  • Open Access
2 Citations
1,336 Views
10 Pages

A Reflection-Based Ultra-Fast Measurement Method for the Continuous Characterization of Self-Heating for Advanced MOSFETs

  • Wei Liu,
  • Guoqixin Huang,
  • Yaru Ding,
  • Chu Yan and ,
  • Xinwei Yu,
  • Liang Zhao and
  • Yi Zhao
  • + 2 authors+ 0 author

As semiconductor devices approach the sub-10 nm technology node, the self-heating effect (SHE) induced by confined geometries (e.g., FinFETs and nanosheet FETs) has emerged as a critical bottleneck affecting both performance and reliability. This cha...

(This article belongs to the Section Semiconductor Devices)
  • Feature Paper
  • Article
  • Open Access
32 Citations
6,529 Views
17 Pages

Identification of Buffer and Surface Traps in Fe-Doped AlGaN/GaN HEMTs Using Y21 Frequency Dispersion Properties

  • P. Vigneshwara Raja,
  • Nandha Kumar Subramani,
  • Florent Gaillard,
  • Mohamed Bouslama and ,
  • Raphaël Sommet and
  • Jean-Christophe Nallatamby
  • + 1 author+ 0 author

13 December 2021

The buffer and surface trapping effects on low-frequency (LF) Y-parameters of Fe-doped AlGaN/GaN high-electron mobility transistors (HEMTs) are analyzed through experimental and simulation studies. The drain current transient (DCT) characterization i...

(This article belongs to the Special Issue Analysis and Test of Microwave Circuits and Subsystems)
  • Article
  • Open Access
12 Citations
9,184 Views
6 Pages

Partial Isolation Type Saddle-FinFET(Pi-FinFET) for Sub-30 nm DRAM Cell Transistors

  • Young Kwon Kim,
  • Jin Sung Lee,
  • Geon Kim,
  • Taesik Park and ,
  • Hui Jung Kim,
  • Young Pyo Cho,
  • Young June Park and
  • Myoung Jin Lee
  • + 3 authors+ 0 author

In this paper, we proposed a novel saddle type FinFET (S-FinFET) to effectively solve problems occurring under the capacitor node of a dynamic random-access memory (DRAM) cell and showed how its structure was superior to conventional S-FinFETs in ter...

(This article belongs to the Special Issue Nanoelectronic Materials, Devices and Modeling)
  • Article
  • Open Access
18 Citations
6,262 Views
11 Pages

1 February 2019

The practical use of tunnel field-effect transistors is retarded by the low on-state current. In this paper, the energy-band engineering of InAs/Si heterojunction and novel device structure of source-pocket concept are combined in a single tunnel fie...

(This article belongs to the Special Issue Modeling of Complex Interfaces: From Surface Chemistry to Nano Chemistry)
  • Article
  • Open Access
6 Citations
9,662 Views
14 Pages

Partial Isolation Type Buried Channel Array Transistor (Pi-BCAT) for a Sub-20 nm DRAM Cell Transistor

  • Jin-sung Lee,
  • Jin-hyo Park,
  • Geon Kim,
  • Hyun Duck Choi and
  • Myoung Jin Lee

13 November 2020

In this paper, we propose a new buried channel array transistor structure to solve the problem of current leakage occurring in the capacitors of dynamic random-access memory (DRAM) cells. This structure has a superior off current performance compared...

(This article belongs to the Special Issue Electrical Characterization, Modeling and Simulation of CMOS Memory Devices)
  • Feature Paper
  • Article
  • Open Access
17 Citations
9,466 Views
19 Pages

Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors

  • Calvin Yi-Ping Chao,
  • Shang-Fu Yeh,
  • Meng-Hsu Wu,
  • Kuo-Yu Chou and ,
  • Honyih Tu,
  • Chih-Lin Lee,
  • Chin Yin,
  • Philippe Paillet and
  • Vincent Goiffon
  • + 4 authors+ 0 author

10 December 2019

In this paper we present a systematic approach to sort out different types of random telegraph noises (RTN) in CMOS image sensors (CIS) by examining their dependencies on the transfer gate off-voltage, the reset gate off-voltage, the photodiode integ...

(This article belongs to the Special Issue Special issue on the 2019 International Image Sensor Workshop (IISW2019))
  • Article
  • Open Access
6 Citations
5,413 Views
13 Pages

10 April 2019

Deprotonation-induced conductivity shift of poly(3,4-ethylenedixoythiophene)s (PEDOTs) in aqueous solutions is a promising platform for chemical or biological sensor due to its large signal output and minimum effect from material morphology. Carboxyl...

(This article belongs to the Section Polymer Applications)
  • Article
  • Open Access
36 Citations
8,963 Views
16 Pages

Ultrasensitive and Highly Selective Graphene-Based Field-Effect Transistor Biosensor for Anti-Diuretic Hormone Detection

  • Reena Sri Selvarajan,
  • Ruslinda A. Rahim,
  • Burhanuddin Yeop Majlis,
  • Subash C. B. Gopinath and
  • Azrul Azlan Hamzah

6 May 2020

Nephrogenic diabetes insipidus (NDI), which can be congenital or acquired, results from the failure of the kidney to respond to the anti-diuretic hormone (ADH). This will lead to excessive water loss from the body in the form of urine. The kidney, th...

(This article belongs to the Special Issue Sensors and Actuators for Wearable and Implantable Devices)
  • Proceeding Paper
  • Open Access
4 Citations
1,862 Views
7 Pages

Impact of the Sensor Temperature on Low Acetone Concentration Detection Using AlGaN/GaN HEMTs

  • Ali Ahaitouf,
  • Yacine Halfaya,
  • Suresh Sundaram,
  • Simon Gautier and ,
  • Paul Voss,
  • Jean Paul Salvestrini and
  • Abdallah Ougazzaden
  • + 2 authors+ 0 author

14 November 2020

In this work, we report on AlGaN/GaN HEMT sensors for acetone concentration below 100ppm and in a broad range of the sensor temperature varying from RT to 300 ∘C. At RT, in the presence of acetone, a smooth and monotonic decrease of the current is ob...

(This article belongs to the Proceedings of 7th International Electronic Conference on Sensors and Applications)
  • Article
  • Open Access
3,193 Views
20 Pages

Impact of Physical and Material Parameters on the Threshold Voltage and the Channel Resistance of Nanowire Field-Effect Transistors for Advanced Nanoscale Devices

  • Rebiha Marki,
  • Lakhdar Dehimi,
  • Kamal Zeghdar,
  • Fortunato Pezzimenti and ,
  • Giacomo Messina and
  • Francesco G. Della Corte
  • + 1 author+ 0 author

31 October 2025

This work studies the impact of different physical and material parameters on the channel resistance, Rch, and threshold voltage, Vth, of nanowire field-effect transistors (NWFETs). In particular, by means of detailed numerical simulations, we invest...

(This article belongs to the Section Power Electronics)
  • Article
  • Open Access
8 Citations
9,046 Views
13 Pages

Assessment of Global Variability in UTBB MOSFETs in Subthreshold Regime

  • Sergej Makovejev,
  • Babak Kazemi Esfeh,
  • François Andrieu,
  • Jean-Pierre Raskin and ,
  • Denis Flandre and
  • Valeriya Kilchytska
  • + 1 author+ 0 author

The global variability of ultra-thin body and buried oxide (UTBB) MOSFETs in subthreshold and off regimes of operation is analyzed. The variability of the off-state drain current, subthreshold slope, drain-induced barrier lowering (DIBL), gate leakag...

(This article belongs to the Special Issue Selected Papers from IEEE S3S Conference 2013)
  • Article
  • Open Access
4 Citations
3,519 Views
18 Pages

Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach

  • Alexander Makarov,
  • Philippe Roussel,
  • Erik Bury,
  • Michiel Vandemaele and ,
  • Alessio Spessot,
  • Dimitri Linten,
  • Ben Kaczer and
  • Stanislav Tyaginov
  • + 3 authors+ 0 author

30 June 2020

We identify correlation between the drain currents in pristine n-channel FinFET transistors and changes in time-0 currents induced by hot-carrier stress. To achieve this goal, we employ our statistical simulation model for hot-carrier degradation (HC...

  • Article
  • Open Access
8 Citations
5,975 Views
16 Pages

Optimization Method of SiC MOSFET Switching Trajectory Based on Variable Current Drive

  • Yeqin Lu,
  • Yannan Yu,
  • Changbin Huang,
  • Jichi Yan and
  • Haoyuan Wu

Silicon carbide (SiC) MOSFETs exhibit superior performance compared to traditional silicon (Si) MOSFETs, characterized by faster switching speeds, lower on-resistance, higher breakdown voltage, and greater operational temperature tolerance. These att...

  • Article
  • Open Access
12 Citations
6,781 Views
7 Pages

Double-Gate Two-Step Source/Drain Poly-Si Thin-Film Transistor

  • Feng-Tso Chien,
  • Chih-Ping Hung,
  • Hsien-Chin Chiu,
  • Tsung-Kuei Kang and ,
  • Ching-Hwa Cheng and
  • Yao-Tsung Tsai
  • + 1 author+ 0 author

A current improved and electric field reduced double-gate (DG) polycrystalline silicon thin-film transistor with two-step source/drain (DGTSD-TFT) design is proposed and demonstrated in this study. The two-step source/drain (TSD) design, which consis...

(This article belongs to the Special Issue Semiconductor Thin Films)
  • Article
  • Open Access
7 Citations
6,307 Views
17 Pages

Channel Engineering for Nanotransistors in a Semiempirical Quantum Transport Model

  • Ulrich Wulf,
  • Jan Kučera,
  • Hans Richter,
  • Manfred Horstmann and ,
  • Maciej Wiatr and
  • Jan Höntschel
  • + 1 author+ 0 author

22 November 2017

One major concern of channel engineering in nanotransistors is the coupling of the conduction channel to the source/drain contacts. In a number of previous publications, we have developed a semiempirical quantum model in quantitative agreement with t...

  • Article
  • Open Access
3 Citations
4,122 Views
10 Pages

Modeling the Effects of Threading Dislocations on Current in AlGaN/GaN HEMT

  • Censong Liu,
  • Jie Wang,
  • Zhanfei Chen,
  • Jun Liu and
  • Jiangtao Su

24 January 2023

The aim of this paper is to model the effects of threading dislocations on both gate and drain currents of AlGaN/GaN high electron mobility transistors (HEMTs). The fraction of filled traps increases with the threading dislocations, while the trappin...

(This article belongs to the Special Issue GaN-Based Semiconductor Devices, Volume II)
  • Article
  • Open Access
10 Citations
4,730 Views
9 Pages

27 April 2020

Tunnel field-effect transistor (Tunnel FET) with asymmetric spacer is proposed to obtain high on-current and reduced inverter delay simultaneously. In order to analyze the proposed Tunnel FET, electrical characteristics are evaluated by technology co...

(This article belongs to the Special Issue New Aspects of Si-Based Material and Device)
  • Article
  • Open Access
4 Citations
2,207 Views
10 Pages

Controlling Drain Side Tunneling Barrier Width in Electrically Doped PNPN Tunnel FET

  • Chan Shan,
  • Lan Yang,
  • Ying Liu,
  • Zi-Meng Liu and
  • Han Zheng

24 January 2023

In this paper, we propose and investigate an electrically doped (ED) PNPN tunnel field effect transistor (FET), in which the drain side tunneling barrier width is effectively controlled to obtain a suppressed ambipolar current. We present that the pr...

  • Article
  • Open Access
7 Citations
4,858 Views
10 Pages

25 January 2022

We present technology computer aided design (TCAD) results for wide band-gap Sn-doped α-Ga2O3 metal–semiconductor field-effect transistors (MESFETs). In particular, the effect of gate work function and electrode gap length on the electric...

(This article belongs to the Section Electronic Materials)
  • Article
  • Open Access
8 Citations
5,266 Views
14 Pages

23 April 2024

Due to the influence of parasitic internal parameters and junction capacitance, the silicon carbide (SiC) power devices are frequently marred by significant overshoots in current and voltage, as well as high-frequency oscillations during the switchin...

(This article belongs to the Topic Advanced Energy and Propulsion Technology for Electric and Intelligent Transportation)
  • Feature Paper
  • Article
  • Open Access
2,314 Views
12 Pages

In this work, conventional and drain offset junctionless (JL) finlike thin-film transistors (FinTFTs) with and without extended gate field plate (E-GFP) are fabricated. Drain offset JL FinTFTs showed a higher breakdown voltage than that of the conven...

(This article belongs to the Section Microelectronics)
  • Article
  • Open Access
4 Citations
9,970 Views
13 Pages

Equivalent Circuit Modeling of a Dual-Gate Graphene FET

  • Saima Hasan,
  • Abbas Z. Kouzani and
  • M A Parvez Mahmud

This paper presents a simple and comprehensive model of a dual-gate graphene field effect transistor (FET). The quantum capacitance and surface potential dependence on the top-gate-to-source voltage were studied for monolayer and bilayer graphene cha...

(This article belongs to the Section Semiconductor Devices)
  • Article
  • Open Access
3 Citations
5,451 Views
5 Pages

14 December 2019

An organic ferroelectric capacitor, using polyvinylidene difluoride (PVDF) as the dielectric, was fabricated. By connecting the PVDF capacitor in series to the gate of a commercially purchased metal-oxide–semiconductor field-effect transistor (...

(This article belongs to the Special Issue Selected Papers from Taiwan Association for Academic Innovation, TAAI 2019)
  • Review
  • Open Access
20 Citations
7,314 Views
9 Pages

The Role of Abdominal Drain Cultures in Managing Abdominal Infections

  • Jan J. De Waele,
  • Jerina Boelens,
  • Dirk Van De Putte,
  • Diana Huis In ‘t Veld and
  • Tom Coenye

Intra-abdominal infections (IAI) are common in hospitalized patients, both in and outside of the intensive care unit. Management principles include antimicrobial therapy and source control. Typically, these infections are polymicrobial, and intra-ope...

(This article belongs to the Special Issue Antibiotic Usage in Acute Situations)
  • Article
  • Open Access
4 Citations
6,149 Views
8 Pages

Self-Adaption of the GIDL Erase Promotes Stacking More Layers in 3D NAND Flash

  • Tao Yang,
  • Bao Zhang,
  • Qi Wang,
  • Lei Jin and
  • Zhiliang Xia

20 March 2023

The bit density is generally increased by stacking more layers in 3D NAND Flash. Gate-induced drain leakage (GIDL) erase is a critical enabler in the future development of 3D NAND Flash. The relationship between the drain-to-body potential (Vdb) of G...

(This article belongs to the Special Issue Advances in Emerging Nonvolatile Memory, Volume II)

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