- Article
Nanoscale Characterization of Graphene Oxide-Based Epoxy Nanocomposite Using Inverted Scanning Microwave Microscopy
- C. H. Joseph,
- Francesca Luzi,
- S. N. Afifa Azman,
- Pietro Forcellese,
- Eleonora Pavoni,
- Gianluca Fabi,
- Davide Mencarelli,
- Serena Gentili,
- Luca Pierantoni and
- Marco Farina
- + 4 authors
Scanning microwave microscopy (SMM) is a novel metrological tool that advances the quantitative, nanometric, high-frequency, electrical characterization of a broad range of materials of technological importance. In this work, we report an inverted ne...