- Article
Fault Prediction Modeling for High-Impact Recorders Based on IPSO-SVM
- Linyu Li,
- Wenbin You and
- Yonghong Ding
The challenge in reusing high-impact recorders lies in developing an efficient and accurate failure prediction model under small-sample conditions. To address this issue, this study proposes an IPSO-SVM model. First, the particle swarms in the IPSO a...