- Article
Investigation of Electrical Properties of the Al/SiO2/n++-Si Resistive Switching Structures by Means of Static, Admittance, and Impedance Spectroscopy Measurements
- Piotr Wiśniewski,
- Jakub Jasiński,
- Andrzej Mazurak,
- Bartłomiej Stonio and
- Bogdan Majkusiak
In this study, the resistive switching phenomenon in Al/SiO2/n++-Si structures is observed and studied by means of DC, small-signal admittance, and complex impedance spectroscopy measurements. Possible transport mechanisms in the high and low resista...