Skin Admittance Measurement for Emotion Recognition: A Study over Frequency Sweep
Greco, A.; Lanata, A.; Citi, L.; Vanello, N.; Valenza, G.; Scilingo, E.P. Skin Admittance Measurement for Emotion Recognition: A Study over Frequency Sweep. Electronics 2016, 5, 46. https://doi.org/10.3390/electronics5030046
Greco A, Lanata A, Citi L, Vanello N, Valenza G, Scilingo EP. Skin Admittance Measurement for Emotion Recognition: A Study over Frequency Sweep. Electronics. 2016; 5(3):46. https://doi.org/10.3390/electronics5030046
Chicago/Turabian StyleGreco, Alberto, Antonio Lanata, Luca Citi, Nicola Vanello, Gaetano Valenza, and Enzo Pasquale Scilingo. 2016. "Skin Admittance Measurement for Emotion Recognition: A Study over Frequency Sweep" Electronics 5, no. 3: 46. https://doi.org/10.3390/electronics5030046