Metrology

Metrology is an international, peer-reviewed, open access journal on the science and technology of measurement and metrology, published quarterly online by MDPI.
  • Open Access— free for readers, with article processing charges (APC) paid by authors or their institutions.
  • High Visibility: indexed within Scopus and other databases.
  • Rapid Publication: manuscripts are peer-reviewed and a first decision is provided to authors approximately 28.5 days after submission; acceptance to publication is undertaken in 7.3 days (median values for papers published in this journal in the first half of 2024).
  • Recognition of Reviewers: APC discount vouchers, optional signed peer review, and reviewer names published annually in the journal.
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Topic in Applied Sciences, JMMP, Materials, Metrology, Sensors, Standards
Measurement Strategies and Standardization in Manufacturing Topic Editors: Manuel Rodríguez-Martín, João Ribeiro, Roberto García Martín
Deadline: 20 December 2024
Special Issue in Metrology
Developments in 3D Metrology Selected from the 3D Metrology Conference Guest Editors: Robert Schmitt, Stephen Kyle, Ben Hughes, Stuart Robson
Deadline: 30 November 2024
Special Issue in Metrology
Next-Level Surface Metrology—Advances in Sensors, Data Analysis and Simulation Guest Editors: Steve Vanlanduit, Stuart T. Smith, Christopher Taudt
Deadline: 25 January 2025
Special Issue in Metrology
Advancements in Optical Measurement Devices and Technologies Guest Editors: Michele Norgia, Rahul Kumar
Deadline: 25 January 2025
Special Issue in Metrology
Advances in Laser Interferometry for Precision Engineering Guest Editors: Ruitao Yang, Han Haitjema, Pengcheng Hu
Deadline: 15 February 2025
Topical Collection in Metrology
Measurement Uncertainty Collection Editor: Simona Salicone
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