Metrology is an international, peer-reviewed, open access journal on the science and technology of measurement and metrology, published quarterly online by MDPI.
  • Open Access—free to download, share, and reuse content. Authors receive recognition for their contribution when the paper is reused.
  • Rapid Publication: first decisions in 15 days; acceptance to publication in 3 days (median values for MDPI journals in the second half of 2021).
  • Recognition of Reviewers: APC discount vouchers, optional signed peer review, and reviewer names published annually in the journal.
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Topic in Automation, Fibers, Metrology, Photonics, Sensors
Advance and Applications of Fiber Optic Measurement Topic Editors: Flavio Esposito, Stefania Campopiano, Agostino Iadicicco
Deadline: 31 March 2023
Topic in Applied Sciences, Metrology, Sensors, Photonics, Machines
Manufacturing Metrology Topic Editors: Fang Cheng, Qian Wang, Tegoeh Tjahjowidodo, Ziran Chen
Deadline: 31 May 2023
Special Issue in Metrology
New Trends and Advances in Manufacturing Metrology Guest Editor: Shivakumar Raman
Deadline: 31 July 2022
Special Issue in Metrology
Frequency Metrology Guest Editor: Gianluca Galzerano
Deadline: 30 October 2022
Special Issue in Metrology
Women’s Special Issue Series: Metrology Guest Editors: Annalisa Liccardo, Samanta Piano
Deadline: 31 March 2023
Topical Collection in Metrology
Measurement Uncertainty Collection Editor: Simona Salicone
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