Metrology is an international, peer-reviewed, open access journal on the science and technology of measurement and metrology, published quarterly online by MDPI.
  • Open Access— free for readers, with article processing charges (APC) paid by authors or their institutions.
  • Rapid Publication: manuscripts are peer-reviewed and a first decision is provided to authors approximately 29.7 days after submission; acceptance to publication is undertaken in 4.9 days (median values for papers published in this journal in the second half of 2022).
  • Recognition of Reviewers: APC discount vouchers, optional signed peer review, and reviewer names published annually in the journal.
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Topic in Applied Sciences, JMMP, Materials, Metrology, Sensors, Standards
Measurement Strategies and Standardization in Manufacturing Topic Editors: Manuel Rodríguez-Martín, João Ribeiro, Roberto García Martín
Deadline: 20 December 2024
Special Issue in Metrology
Next Level Surface Metrology—towards Photonic Metrology and Surface Processing Guest Editors: Steve Vanlanduit, Stuart T. Smith, Christopher Taudt
Deadline: 15 June 2023
Special Issue in Metrology
Power and Electronic Measurement Systems Guest Editors: Pedro M. Ramos, Bogdan-Adrian Enache
Deadline: 25 July 2023
Special Issue in Metrology
Open Challenges of On-Machine and In-Process Metrology for Precision Manufacturing Guest Editors: Sudhanshu Nahata, Shengyu Shi, Nicola Senin, Jorge Santolaria Mazo
Deadline: 15 September 2023
Special Issue in Metrology
Advances in Laser Interferometry for Precision Engineering Guest Editors: Ruitao Yang, Han Haitjema, Pengcheng Hu
Deadline: 31 December 2023
Topical Collection in Metrology
Measurement Uncertainty Collection Editor: Simona Salicone
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