- Article
Comparison of Total Ionizing Dose Effects in 22-nm and 28-nm FD SOI Technologies
- Zongru Li,
- Christopher Jarrett Elash,
- Chen Jin,
- Li Chen,
- Jiesi Xing,
- Zhiwu Yang and
- Shuting Shi
Total ionizing dose (TID) effects from Co-60 gamma ray and heavy ion irradiation were studied at the 22-nm FD SOI technology node and compared with the testing results from the 28-nm FD SOI technology. Ring oscillators (RO) designed with inverters, N...