- Article
Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode
- Haitao Zhang,
- Xuanwu Kang,
- Yingkui Zheng,
- Ke Wei,
- Hao Wu,
- Xinyu Liu,
- Tianchun Ye and
- Zhi Jin
In this study, a dedicated dynamic measurement system was used to investigate the transient capacitance and recovery process of AlGaN/GaN lateral Schottky barrier diodes (SBDs). With the consideration of acceptor traps in the C-doped buffer, the C-V...