You are currently viewing a new version of our website. To view the old version click .

Most Recent

  • Article
  • Open Access
Metrology2025, 5(4), 77;https://doi.org/10.3390/metrology5040077 
(registering DOI)

14 December 2025

The calibration of levelling staff is a key prerequisite for achieving high-precision levelling. Traditionally, this process is carried out using laser interferometric systems, which provide the required accuracy but are demanding in terms of operati...

  • Article
  • Open Access
179 Views
12 Pages

Towards the Development of an Optical Quantum Frequency Standard Feasible for a Medium-Size NMI

  • Adriana Palos,
  • Ismael Caballero,
  • Daniel de Mercado,
  • Yolanda Álvarez,
  • David Peral and
  • Javier Díaz de Aguilar

8 December 2025

Centro Español de Metrología (CEM) is developing a quantum frequency standard based on trapped calcium ions, marking its entry into the landscape of the second quantum revolution. Optical frequency standards offer unprecedented precisio...

  • Review
  • Open Access
303 Views
22 Pages

The Critical Role of International Comparisons in Global Metrology System: An Overview

  • Patrice Salzenstein,
  • Thomas Y. Wu and
  • Ekaterina Pavlyuchenko

3 December 2025

International comparisons play a critical role in ensuring precision, accuracy, consistency, and trust in the global metrology system. The Comité International des Poids et Mesures (CIPM) established the Mutual Recognition Arrangement (MRA) in...

  • Article
  • Open Access
162 Views
21 Pages

Verification of Microprobe Calibration Based on Actual Diameter Measurement of the Probe Tip Sphere

  • So Ito,
  • Daichi Inukai,
  • Takehiro Tomioka,
  • Yasutomo Sugisawa,
  • Kenta Matsumoto and
  • Kazuhide Kamiya

1 December 2025

In three-dimensional measurement using a microprobing system with a micrometric spherical tip, a deviation in the diameter of the probe tip sphere causes measurement errors. In a typical probing system calibration, the effective diameter of the probe...

  • Article
  • Open Access
178 Views
15 Pages

VNA Tools—A Metrology Software Supporting the Digital Traceability Chain

  • Markus Zeier,
  • Michael Wollensack,
  • Johannes Hoffmann,
  • Peter Morrissey,
  • Juerg Ruefenacht and
  • Daniel Stalder

1 December 2025

This paper presents METAS VNA Tools Version 2.9.0, a metrology software suite designed to support the digital traceability chain in vector network analyzer measurements. Built on the METAS UncLib Version 2.9.0 uncertainty engine, the software enables...

  • Article
  • Open Access
257 Views
19 Pages

18 November 2025

The cross-correlation algorithm, widely used for transit-time determination in ultrasonic gas flowmeters, becomes susceptible to significant errors under high flow rates. Fluid disturbances and noise distort ultrasonic waveforms, causing cycle-skippi...

  • Article
  • Open Access
342 Views
9 Pages

18 November 2025

Data spaces are digital realms of data and information shared between stakeholders and peer groups. They underpin several developments in sectors ranging from the automotive industry, through social sciences, to governmental networks. Digital traceab...

  • Article
  • Open Access
552 Views
16 Pages

A Highly Efficient, Low-Cost Microwave Resonator for Exciting a Diamond Sample from a Miniaturized Quantum Magnetometer

  • André Bülau,
  • Daniela Walter,
  • Magnus Kofoed,
  • Florian Janek,
  • Volker Kible and
  • Karl-Peter Fritz

17 November 2025

Optically detected magnetic resonance (ODMR) of nitrogen-vacancy centers in diamonds, in addition to optical excitation with green light, requires microwave excitation and thus a microwave structure. While many different microwave structures includin...

  • Article
  • Open Access
296 Views
21 Pages

9 November 2025

Measurement systems such as laser trackers and 3D imaging systems are being increasingly adopted across the manufacturing industry. These metrology technologies can allow for live, high-precision measurement in a digital system, enabling the spatial...

Get Alerted

Add your email address to receive forthcoming issues of this journal.

XFacebookLinkedIn
Metrology - ISSN 2673-8244