- 1.5Impact Factor
- 2.6CiteScore
- 37 daysTime to First Decision
Special Issues
Metrology publishes Special Issues to create collections of papers on specific topics, with the aim of building a community of authors and readers to discuss the latest research and develop new ideas and research directions. Special Issues are led by Guest Editors, who are experts on the topic and all Special Issue submissions follow MDPI's standard editorial process.
The journal’s Editor-in-Chief and/or designated Editorial Board Member will oversee Guest Editor appointments and Special Issue proposals, checking their content for relevance and ensuring the suitability of the material for the journal. The papers published in a Special Issue will be collected and displayed on a dedicated page of the journal’s website. Further information on MDPI's Special Issue polices and Guest Editor responsibilities can be found here. For any inquiries related to a Special Issue, please contact the Editorial Office.
Applied Industrial Metrology: Methods, Uncertainties, and Challenges
Deadline: 25 June 2026
Advances in Metrology for Artificial Intelligence and Neural Network Applications
Deadline: 25 June 2026
Measuring by Light: Innovations in Optical Measurement and Sensing for Advanced Metrology
Deadline: 15 June 2026
Feature Papers Collection: Celebration of the First Impact Factor of Metrology
Deadline: 1 May 2026
Advances in Seismic Measurement Devices and Technologies
Deadline: 15 March 2026
Measurement Framework for Low-Inertia Power Systems
Deadline: 15 January 2026
Metrological Traceability
Deadline: 31 December 2025
Advances in Optical 3D Metrology
Deadline: 30 September 2025
Advancements in Optical Measurement Devices and Technologies
Deadline: 25 August 2025
Advances in Magnetic Measurements
Deadline: 25 March 2025
Novel Dynamic Measurement Methods and Systems
Deadline: 30 June 2024
Power and Electronic Measurement Systems
Deadline: 15 April 2024
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