Metrology

Metrology publishes Special Issues to create collections of papers on specific topics, with the aim of building a community of authors and readers to discuss the latest research and develop new ideas and research directions. Special Issues are led by Guest Editors, who are experts on the topic and all Special Issue submissions follow MDPI's standard editorial process. The journal’s Editor-in-Chief and/or designated Editorial Board Member will oversee Guest Editor appointments and Special Issue proposals, checking their content for relevance and ensuring the suitability of the material for the journal. The papers published in a Special Issue will be collected and displayed on a dedicated page of the journal’s website. Further information on MDPI's Special Issue policies and Guest Editor responsibilities can be found here. For any inquiries related to a Special Issue, please contact the Editorial Office.

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Estimation and Prediction of Coordinate Measurement Uncertainty: Recent Trends and Developments

edited by

Adam Gąska

and

Danuta Owczarek

submission deadline 15 Oct 2026 | 1 articles | Viewed by 717 | Submission Open

Keywords: uncertainty estimation; prediction; simulation; virtual machines; digital twins; databases; artificial intelligence; machine learning; coordinate measuring machines (CMMs); virtual coordinate measuring machine

Advances in Metrology for Artificial Intelligence and Neural Network Applications

edited by

Pedro M. Ramos

Egidio De Benedetto

and

Antonio Esposito

submission deadline 31 Oct 2026 | 3 articles | Viewed by 2446 | Submission Open

Keywords: metrology; artificial intelligence; neural networks; measurement uncertainty; data quality; digital metrology; machine learning; model validation; traceability; uncertainty quantification

Metrology in Modern Measurement Systems and Sensors: Design, Application, Research and Challenges

edited by

Piotr Kuwalek

Grzegorz Wiczyński

and Mariusz Rząsa

submission deadline 31 Oct 2026 | 1 articles | Viewed by 553 | Submission Open

Keywords: measurements; measurement diagnostics; measurement infrastructure; metrology; signal analysis; signal processing

Advancements in Optical Measurement Devices and Technologies: 2nd Edition

edited by

Michele Norgia

and Rahul Kumar

submission deadline 15 Nov 2026 | 2 articles | Viewed by 914 | Submission Open

Keywords: optical sensors; fiber optic sensing; laser interferometry; spectroscopy; lidar; frequency comb; biophotonics; optical imaging; laser Doppler velocimetry; environmental sensing; biomedical applications; precision metrology; measurement technologies; artificial intelligence; machine learning; data-driven metrology; intelligent sensing; sensor fusion

Recent and Future Trends in Surface Topography Metrology

edited by

Michal Wieczorowski

Tomasz Bartkowiak

Chris Brown

, Maxence Bigerelle and François Berkmans

submission deadline 25 Nov 2026 | Viewed by 140 | Submission Open

Keywords: surface metrology; surface topography; areal parameters; traceability; calibration; measurement uncertainty; reference artefacts; filtering; multi-scale analysis; in-line metrology

Optical and Vision-Based Measurement in Extreme Environments

edited by Wenlong Li, Wenpan Li and Wei Xu

submission deadline 25 Jan 2027 | Viewed by 131 | Submission Open

Keywords: extreme environments; optical diagnostics; vision-based measurement; large-scale morphology scanning; deformation and strain analysis; high-speed imaging; high-temperature testing; flow visualization; multi-field coupling

Applied Industrial Metrology: Methods, Uncertainties, and Challenges: 2nd Edition

edited by

Patrice Salzenstein

submission deadline 23 Feb 2027 | 2 articles | Viewed by 715 | Submission Open

Keywords: measurement uncertainty; industrial calibration laboratories; metrology methods; gas flow; particle size; length

Additive Manufacturing for High-Performance Applications: Metrology, Process Control, and Qualification Across the AM Value Chain

edited by

Mojtaba Ahmadieh Khanesar

and

Theresa Buchenau

submission deadline 31 Mar 2027 | Viewed by 62 | Submission Open

Keywords: dimension metrology; surface metrology; additive manufacturing; dimensional accuracy; tolerancing; virtual instruments; optimization

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