Special Issues

Metrology publishes Special Issues to create collections of papers on specific topics, with the aim of building a community of authors and readers to discuss the latest research and develop new ideas and research directions. Special Issues are led by Guest Editors, who are experts on the topic and all Special Issue submissions follow MDPI's standard editorial process. The journal’s Editor-in-Chief and/or designated Editorial Board Member will oversee Guest Editor appointments and Special Issue proposals, checking their content for relevance and ensuring the suitability of the material for the journal. The papers published in a Special Issue will be collected and displayed on a dedicated page of the journal’s website. Further information on MDPI's Special Issue polices and Guest Editor responsibilities can be found here. For any inquiries related to a Special Issue, please contact the Editorial Office.

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Next-Level Surface Metrology—Advances in Sensors, Data Analysis and Simulation submission deadline 25 Jan 2025 | 3 articles | Viewed by 3640 | Submission Open
Advancements in Optical Measurement Devices and Technologies
edited by and
submission deadline 25 Jan 2025 | 3 articles | Viewed by 2055 | Submission Open
Keywords: optical sensors; fiber optic sensing; laser interferometry; spectroscopy; lidar; frequency comb; biophotonics; optical imaging; laser doppler velocimetry; environmental sensing; biomedical applications; precision metrology; measurement technologies
Advances in Laser Interferometry for Precision Engineering
edited by , and Pengcheng Hu
submission deadline 15 Feb 2025 | 3 articles | Viewed by 5065 | Submission Open
Keywords: key components or devices for laser interferometry; novel interferometric system for metrology; calibration and comparison system for interferometers; new applications of laser interferometry; special geometrical parameter measurement with interferometers
Advances in Magnetic Measurements
edited by Nicholas Sammut
submission deadline 25 Mar 2025 | 1 articles | Viewed by 1648 | Submission Open
Metrological Traceability
edited by
submission deadline 31 May 2025 | Viewed by 280 | Submission Open
Keywords: metrological traceability; measurement standard; measurement uncertainty; quality infrastructure; calibration; digitalization; digital transformation
Advances in Optical 3D Metrology
edited by Giorgio Vassena, and
submission deadline 25 Jun 2025 | 2 articles | Viewed by 2077 | Submission Open
Keywords: photogrammetry; active sensors; sensor calibration; bundle adjustment; quality control; accuracy
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