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Special Issues

Metrology publishes Special Issues to create collections of papers on specific topics, with the aim of building a community of authors and readers to discuss the latest research and develop new ideas and research directions. Special Issues are led by Guest Editors, who are experts on the topic and all Special Issue submissions follow MDPI's standard editorial process.

The journal’s Editor-in-Chief and/or designated Editorial Board Member will oversee Guest Editor appointments and Special Issue proposals, checking their content for relevance and ensuring the suitability of the material for the journal. The papers published in a Special Issue will be collected and displayed on a dedicated page of the journal’s website. Further information on MDPI's Special Issue polices and Guest Editor responsibilities can be found here. For any inquiries related to a Special Issue, please contact the Editorial Office.

Open for Submission

Applied Industrial Metrology: Methods, Uncertainties, and Challenges

Guest Editor: Patrice Salzenstein
1 article | Viewed by 623

Deadline: 25 June 2026

Open for Submission

Advances in Metrology for Artificial Intelligence and Neural Network Applications

Guest Editors: Pedro M. Ramos, Egidio De Benedetto, Antonio Esposito
Viewed by 187

Deadline: 25 June 2026

Open for Submission

Measuring by Light: Innovations in Optical Measurement and Sensing for Advanced Metrology

Guest Editors: Steve Vanlanduit, Yuanchen Zeng
2 articles | Viewed by 2,610

Deadline: 15 June 2026

Open for Submission

Feature Papers Collection: Celebration of the First Impact Factor of Metrology

Guest Editors: Han Haitjema, Markus Bär, Samanta Piano
1 article | Viewed by 1,160

Deadline: 1 May 2026

Open for Submission

Advances in Seismic Measurement Devices and Technologies

Guest Editor: Livio D'Alvia
Viewed by 123

Deadline: 15 March 2026

Open for Submission

Measurement Framework for Low-Inertia Power Systems

Guest Editor: Guglielmo Frigo
Viewed by 274

Deadline: 15 January 2026

Closed

Metrological Traceability

Guest Editor: Blair Hall
5 articles | Viewed by 8,290

Deadline: 31 December 2025

Closed

Advances in Optical 3D Metrology

Guest Editors: Giorgio Vassena, Fabio Remondino, Mark Shortis
5 articles | Viewed by 9,125

Deadline: 30 September 2025

Closed

Advancements in Optical Measurement Devices and Technologies

Guest Editors: Michele Norgia, Rahul Kumar
12 articles | Viewed by 21,074

Deadline: 25 August 2025

Closed

Advances in Magnetic Measurements

Guest Editor: Nicholas Sammut
6 articles | Viewed by 10,360

Deadline: 25 March 2025

Closed

Novel Dynamic Measurement Methods and Systems

Guest Editors: Lukasz Scislo, Nina Szczepanik-Scislo, Serge Demidenko
5 articles | Viewed by 22,924

Deadline: 30 June 2024

Closed

Power and Electronic Measurement Systems

Guest Editors: Pedro M. Ramos, Bogdan-Adrian Enache
5 articles | Viewed by 14,448

Deadline: 15 April 2024

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Metrology - ISSN 2673-8244