- Review
 
Next-Generation Interferometry with Gauge-Invariant Linear Optical Scatterers
- Christopher R. Schwarze,
 - Anthony D. Manni,
 - David S. Simon,
 - Abdoulaye Ndao and
 - Alexander V. Sergienko
 
Measurement technology employing optical interference phenomena such as a fringe pattern or frequency shift has been evolving for more than a century. Systems are being designed better, and their components are being built better. However, the major...

