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  • Article
  • Open Access
23 Citations
8,186 Views
16 Pages

Deep Learning for Concrete Crack Detection and Measurement

  • Mthabisi Adriano Nyathi,
  • Jiping Bai and
  • Ian David Wilson

5 February 2024

Concrete structures inevitably experience cracking, which is a common form of damage. If cracks are left undetected and allowed to worsen, catastrophic failures, with costly implications for human life and the economy, can occur. Traditional image pr...

  • Review
  • Open Access
13 Citations
7,660 Views
30 Pages

Measurement Techniques for Three-Dimensional Metrology of High Aspect Ratio Internal Features—A Review

  • Tom Hovell,
  • Jon Petzing,
  • Wen Guo,
  • Connor Gill,
  • Laura Justham,
  • Niels Lohse and
  • Peter Kinnell

17 April 2023

Non-destructive measurements of high aspect ratio microscale features, especially those with internal geometries such as micro-holes, remain a challenging metrology problem that is increasing in difficulty due to the increasing requirement for more c...

  • Article
  • Open Access
17 Citations
6,269 Views
36 Pages

3D Model-Based Large-Volume Metrology Supporting Smart Manufacturing and Digital Twin Concepts

  • Richard P. Lindqvist,
  • Daniel Strand,
  • Mikael Nilsson,
  • Victor Collins,
  • Johan Torstensson,
  • Jonas Kressin,
  • Domenico Spensieri and
  • Andreas Archenti

18 January 2023

New automated laser radar measurement systems at the Saab Inc. West Lafayette, USA, facility will make airframe assembly of the aft body for the new eT7-A aircraft a quicker, more cost-efficient process. Digital twin concepts realized through simulat...

  • Review
  • Open Access
2 Citations
4,804 Views
39 Pages

Learning-Based 3D Reconstruction Methods for Non-Collaborative Surfaces—A Metrological Evaluation

  • Ziyang Yan,
  • Nazanin Padkan,
  • Paweł Trybała,
  • Elisa Mariarosaria Farella and
  • Fabio Remondino

Non-collaborative (i.e., reflective, transparent, metallic, etc.) surfaces are common in industrial production processes, where 3D reconstruction methods are applied for quantitative quality control inspections. Although the use or combination of pho...

  • Article
  • Open Access
1 Citations
4,765 Views
19 Pages

5 March 2024

Voltage standards are widely used to transfer volts from Josephson voltage standards (JVSs) at national metrology institutes (NMIs) into calibration labs to maintain the volts and to transfer them to test equipment at production lines. Therefore, com...

  • Article
  • Open Access
6 Citations
4,687 Views
20 Pages

Measurement Uncertainty Evaluation for Sensor Network Metrology

  • Peter Harris,
  • Peter Friis Østergaard,
  • Shahin Tabandeh,
  • Henrik Söderblom,
  • Gertjan Kok,
  • Marcel van Dijk,
  • Yuhui Luo,
  • Jonathan Pearce,
  • Declan Tucker and
  • Anupam Prasad Vedurmudi
  • + 1 author

Sensor networks, which are increasingly being used in a broad range of applications, constitute a measurement paradigm involving ensembles of sensors measuring possibly different quantities at a discrete sample of spatial locations and temporal point...

  • Review
  • Open Access
2 Citations
4,642 Views
45 Pages

Advancing Metal Additive Manufacturing: A Review of Numerical Methods in DED, WAAM, and PBF

  • Allen Love,
  • Omar Alejandro Valdez Pastrana,
  • Saeed Behseresht and
  • Young Ho Park

Metal additive manufacturing (AM) techniques such Direct Energy Deposition (DED), Powder Bed Fusion (PBF), and Wire Arc Additive Manufacturing (WAAM) enable the production of complex metal components built at rapid rates. Because of the complexity of...

  • Article
  • Open Access
6 Citations
4,428 Views
15 Pages

18 May 2023

The Tsallis q-Gaussian distribution is a powerful generalization of the standard Gaussian distribution and is commonly used in various fields, including non-extensive statistical mechanics, financial markets and image processing. It belongs to the q-...

  • Article
  • Open Access
4,287 Views
12 Pages

Spectroscopic Reflectometry for Optimizing 3D Through-Silicon-Vias Process

  • Yi-Sha Ku,
  • Chun-Wei Lo,
  • Cheng-Kang Lee,
  • Chia-Hung Cho,
  • Wen-Qii Cheah and
  • Po-Wen Chou

22 November 2023

The main challenges in 3D metrology involve measuring TSVs etched with very high aspect ratios, where the via depth to diameter ratio approaches 10:1–20:1. In this paper, we introduce an innovative approach to enhance our in-house spectroscopic...

  • Article
  • Open Access
3 Citations
4,277 Views
22 Pages

Comparison of Dimensional Accuracy between a Laser Scanner and a Laser Tracker with Handheld Scan in a Laboratory Setting

  • Alex Krummenauer,
  • Douglas Bergamo,
  • Roberto Serpa Soares,
  • Victor Emmanuel de Oliveira Gomes and
  • Vitor Camargo Nardelli

12 April 2024

The dimensional accuracy of a laser scanner has been extensively evaluated using various measurement methods and diverse reference standards. This study specifically focuses on two key considerations. Firstly, it assesses the dimensional accuracy of...

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Metrology - ISSN 2673-8244