- Article
Assessment of Measurement Uncertainty for S-Parameter Measurement Based on Covariance Matrix
- Jiangmiao Zhu,
- Yifan Wang,
- Kejia Zhao,
- Yidi Wang,
- Chaoxian Fu and
- Kaige Man
S-parameters are widely used to detail the scattering parameters of radio frequency (RF) components and microwave circuit modules. The vector network analyzer (VNA) is the most commonly used device for measuring S-parameters. Given the multiple frequ...