- Communication
Transition from Screw-Type to Edge-Type Misfit Dislocations at InGaN/GaN Heterointerfaces
- Quantong Li,
- Albert Minj,
- Yunzhi Ling,
- Changan Wang,
- Siliang He,
- Xiaoming Ge,
- Chenguang He,
- Chan Guo,
- Jiantai Wang and
- Pierre Ruterana
- + 2 authors
We have investigated the interface dislocations in InxGa1−xN/GaN heterostructures (0 ≤ x ≤ 0.20) using diffraction contrast analysis in a transmission electron microscope. The results indicate that the structural properties of interface d...