- Feature Paper
- Article
In Situ Plasma Impedance Monitoring of the Oxide Layer PECVD Process
- Hyun Keun Park,
- Wan Soo Song and
- Sang Jeen Hong
The use of plasma in semiconductor fabrication processes has been continuously increasing because of the miniaturization of semiconductor device structure, and plasma enhanced chemical vapor deposition (PECVD) has become a major process in thin film...