- Article
A Unified Current-Voltage Model for Metal Oxide-Based Resistive Random-Access Memory
- Harry Chung,
- Hyungsoon Shin,
- Jisun Park and
- Wookyung Sun
Resistive random-access memory (RRAM) is essential for developing neuromorphic devices, and it is still a competitive candidate for future memory devices. In this paper, a unified model is proposed to describe the entire electrical characteristics of...