- Article
Modeling of Statistical Variation Effects on DRAM Sense Amplifier Offset Voltage
- Kyung Min Koo,
- Woo Young Chung,
- Sang Yi Lee,
- Gyu Han Yoon and
- Woo Young Choi
With the downscaling in device sizes, process-induced parameter variation has emerged as one of the most serious problems. In particular, the parameter fluctuation of the dynamic random access memory (DRAM) sense amplifiers causes an offset voltage,...