Skip to Content

23 Results Found

  • Article
  • Open Access
18 Citations
7,684 Views
16 Pages

Process Control in Jet Electrochemical Machining of Stainless Steel through Inline Metrology of Current Density

  • Matin Yahyavi Zanjani,
  • Matthias Hackert-Oschätzchen,
  • André Martin,
  • Gunnar Meichsner and ,
  • Jan Edelmann and
  • Andreas Schubert
  • + 1 author+ 0 author

18 April 2019

Jet electrochemical machining (Jet-ECM) is a flexible method for machining complex microstructures in high-strength and hard-to-machine materials. Contrary to mechanical machining, in Jet-ECM there is no mechanical contact between tool and workpiece....

(This article belongs to the Special Issue Product/Process Fingerprint in Micro Manufacturing)
  • Article
  • Open Access
17 Citations
5,093 Views
29 Pages

Connectivity as a Design Feature for Industry 4.0 Production Equipment: Application for the Development of an In-Line Metrology System

  • Ana Pamela Castro-Martin,
  • Horacio Ahuett-Garza,
  • Darío Guamán-Lozada,
  • Maria F. Márquez-Alderete and ,
  • Pedro D. Urbina Coronado,
  • Pedro A. Orta Castañon,
  • Thomas R. Kurfess and
  • Emilio González de Castilla
  • + 3 authors+ 0 author

1 February 2021

Industry 4.0 (I4.0) is built upon the capabilities of Internet of Things technologies that facilitate the recollection and processing of data. Originally conceived to improve the performance of manufacturing facilities, the field of application for I...

(This article belongs to the Special Issue Smart Manufacturing Systems for Industry 5.0: Challenges and Opportunities)
  • Article
  • Open Access
85 Citations
11,838 Views
22 Pages

Process Understanding of Plasma Electrolytic Polishing through Multiphysics Simulation and Inline Metrology

  • Igor Danilov,
  • Matthias Hackert-Oschätzchen,
  • Mike Zinecker,
  • Gunnar Meichsner and ,
  • Jan Edelmann and
  • Andreas Schubert
  • + 1 author+ 0 author

26 March 2019

Currently, the demand for surface treatment methods like plasma electrolytic polishing (PeP)—a special case of electrochemical machining—is increasing. This paper provides a literature review on the fundamental mechanisms of the plasma el...

(This article belongs to the Special Issue Product/Process Fingerprint in Micro Manufacturing)
  • Article
  • Open Access
11 Citations
4,630 Views
18 Pages

Estimation of Measurement Uncertainty of the Real-Time Location System (RTLS) with Ultra-Wideband (UWB) Technology

  • Alex Krummenauer,
  • Victor Emmanuel de Oliveira Gomes and
  • Vitor Camargo Nardelli

24 March 2023

The need to control the real-time location of assets is increasingly relevant worldwide. The Ultra-wideband (UWB) technology is an IoT solution for real-time locating systems (RTLS). The location of the asset is obtained by the signal exchange betwee...

  • Article
  • Open Access
18 Citations
5,644 Views
15 Pages

Methodology to Evaluate the Performance of Portable Photogrammetry for Large-Volume Metrology

  • Pablo Puerto,
  • Daniel Heißelmann,
  • Simon Müller and
  • Alberto Mendikute

28 June 2022

The increased relevance of large-volume metrology (LVM) in industrial applications entails certain challenges: measurements must be cost-efficient and the technologies must be easy to use while ensuring accuracy and reliability. Portable photogrammet...

(This article belongs to the Special Issue Advances in Portable 3D Measurement)
  • Article
  • Open Access
3 Citations
3,397 Views
19 Pages

Calibration Techniques for Water Content Measurements in Solid Biofuels

  • Henrik Kjeldsen,
  • Peter Friis Østergaard,
  • Helena Strauss,
  • Jan Nielsen and ,
  • Bayan Tallawi,
  • Eric Georgin,
  • Pierre Sabouroux,
  • Jan G. Nielsen and
  • Jens Ole Hougaard
  • + 4 authors+ 0 author

28 January 2024

This paper presents methodologies and equipment for SI-traceable inline measurements of water content (a critical quality parameter) in solid biofuels. Inline measurement systems for water content are commonly used at CHP plants, providing continuous...

(This article belongs to the Collection Bioenergy and Biofuel)
  • Article
  • Open Access
3 Citations
6,447 Views
12 Pages

Spectroscopic Reflectometry for Optimizing 3D Through-Silicon-Vias Process

  • Yi-Sha Ku,
  • Chun-Wei Lo,
  • Cheng-Kang Lee,
  • Chia-Hung Cho and ,
  • Wen-Qii Cheah and
  • Po-Wen Chou
  • + 1 author+ 0 author

22 November 2023

The main challenges in 3D metrology involve measuring TSVs etched with very high aspect ratios, where the via depth to diameter ratio approaches 10:1–20:1. In this paper, we introduce an innovative approach to enhance our in-house spectroscopic...

  • Article
  • Open Access
2 Citations
4,103 Views
21 Pages

20 August 2022

In the framework of the ongoing EMPIR JRP 18HLT08 Metrology for Drug Delivery (MeDDII), a main task is to improve dosing accuracy and enable traceable measurements of volume, flow and pressure of existing drug delivery devices and in-line sensors ope...

  • Article
  • Open Access
1 Citations
913 Views
20 Pages

With the rise of Industry 4.0, digital manufacturing and smart measuring technologies are enabling the development of zero-defect manufacturing strategies, which leads to less material waste and lower energy consumption, moving from off-line metrolog...

  • Article
  • Open Access
30 Citations
5,558 Views
23 Pages

11 June 2018

Micro-injection moulding (μIM) is a replication-based process enabling the cost-effective production of complex and net-shaped miniaturized plastic components. The micro-scaled size of such parts poses great challenges in assessing their dimension...

(This article belongs to the Special Issue Product/Process Fingerprint in Micro Manufacturing)
  • Article
  • Open Access
8 Citations
2,889 Views
19 Pages

Metrological Comparison of Available Methods to Correct Edge-Effect Local Plasticity in Instrumented Indentation Test

  • Jasurkhuja Kholkhujaev,
  • Giacomo Maculotti,
  • Gianfranco Genta and
  • Maurizio Galetto

8 June 2023

The Instrumented Indentation Test (IIT) mechanically characterizes materials from the nano to the macro scale, enabling the evaluation of microstructure and ultra-thin coatings. IIT is a non-conventional technique applied in strategic sectors, e.g.,...

(This article belongs to the Section Advanced Materials Characterization)
  • Proceeding Paper
  • Open Access
731 Views
9 Pages

On the Optimization of Additively Manufactured Part Quality Through Process Monitoring: The Wire DED-LB Case

  • Konstantinos Tzimanis,
  • Michail S. Koutsokeras,
  • Nikolas Porevopoulos and
  • Panagiotis Stavropoulos

17 December 2025

The wire Laser-based Directed Energy Deposition (DED-LB) metal additive manufacturing (AM) process is time- and cost-effective, providing high-quality, dense parts while supporting multi-scale manufacturing, repair, and repurposing services. However,...

(This article belongs to the Proceedings of The 8th International Conference of Engineering Against Failure)
  • Article
  • Open Access
1 Citations
1,014 Views
24 Pages

18 April 2026

Recent advances in machine design, automation, and industrial digitalization have transformed Coordinate Measuring Machines (CMMs) from standalone inspection devices into fully integrated elements of automated manufacturing systems. In the automotive...

(This article belongs to the Special Issue Recent Developments in Machine Design, Automation and Robotics, Second Edition)
  • Review
  • Open Access
1,820 Views
41 Pages

Fueled by the push for “More than Moore”, three-dimensional integrated circuits (3D ICs) have become a backbone of next-generation electronics. Their complex architectures place unprecedented demands on etching technologies, which must no...

(This article belongs to the Special Issue Advanced Etching Technologies for Three-Dimensional Integrated Chips)
  • Article
  • Open Access
7 Citations
3,599 Views
20 Pages

1 February 2023

The focus of this study is to design a backlit vision instrument capable of measuring surface roughness and to discuss its metrological performance compared to traditional measurement instruments. The instrument is a non-contact high-magnification im...

(This article belongs to the Special Issue Selected Papers from the 2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT)
  • Article
  • Open Access
12 Citations
8,778 Views
28 Pages

2 January 2014

During the last years, the use of Portable Coordinate Measuring Machines (PCMMs) in industry has increased considerably, mostly due to their flexibility for accomplishing in-line measuring tasks as well as their reduced costs and operational advantag...

(This article belongs to the Special Issue State-of-the-Art Sensors Technology in Spain 2013)
  • Article
  • Open Access
11 Citations
3,976 Views
9 Pages

Characterization of CMP Slurries Using Densitometry and Refractive Index Measurements

  • Leticia Vazquez Bengochea,
  • Yasa Sampurno,
  • Marcus Kavaljer,
  • Rob Johnston and
  • Ara Philipossian

24 October 2018

We investigated the possibility of employing refractive index (RI) measurements for inline incoming slurry control at the point of use (POU), as an alternative to the widespread densitometry method. As such, it became necessary to determine if RI cou...

(This article belongs to the Section A: Physics)
  • Article
  • Open Access
1,516 Views
15 Pages

Benchmarking Focus Metrics for Microparticle Localization in In-Line Digital Holography

  • Brandon R. Sulvarán-Salmoreno,
  • David Moreno-Hernández and
  • Diego Torres-Armenta

29 May 2026

Accurate axial localization of microparticles is a key requirement in in-line digital holography (ILDH), particularly under noisy conditions and for weakly scattered objects. This work presents experimental and simulated benchmarking of three widely...

(This article belongs to the Special Issue Advances in Biophotonics Using Optical Microscopy Techniques)
  • Article
  • Open Access
8 Citations
2,895 Views
12 Pages

Active Energy Meters Tested in Realistic Non-Sinusoidal Conditions Recorded on the Field and Reproduced in Laboratory

  • Alessandro Cultrera,
  • Gabriele Germito,
  • Danilo Serazio,
  • Flavio Galliana and ,
  • Bruno Trinchera,
  • Giulia Aprile,
  • Martino Chirulli and
  • Luca Callegaro
  • + 3 authors+ 0 author

14 March 2024

Metrological characterisation of static energy meters under realistic low power quality conditions is a basic requirement for proper grid control and fair energy billing. The paper reports about a new proposed methodology, where the meters are tested...

(This article belongs to the Section A1: Smart Grids and Microgrids)
  • Review
  • Open Access
49 Views
29 Pages

30 October 2026

Monolithic perovskite/silicon tandem solar cells have reached certified efficiencies above 35% at small area, while large-area devices have reached the mid-30% range and full-area M10 tandems have exceeded 28%. Translating these gains to industrially...

(This article belongs to the Special Issue Advances in Optoelectronic Devices, 3rd Edition)
  • Article
  • Open Access
1 Citations
1,459 Views
32 Pages

Towards On-Machine Surface Metrology Using Image-Based Frequency Analysis for Surface Variation Analysis

  • Vilhelm Söderberg,
  • Robert Tomkowski,
  • Aleksandra Mirowska and
  • Andreas Archenti

Machined surfaces contain rich information about machining conditions and system behavior and are typically assessed using off-line, small-area metrology. This study developed and validated an image-based methodology for process-oriented surface text...

  • Review
  • Open Access
81 Citations
18,904 Views
51 Pages

13 February 2022

Augmented Reality (AR) has gradually become a mainstream technology enabling Industry 4.0 and its maturity has also grown over time. AR has been applied to support different processes on the shop-floor level, such as assembly, maintenance, etc. As va...

(This article belongs to the Special Issue Advances in Sustainable and Digitalized Factories: Manufacturing, Measuring Technologies and Systems)
  • Article
  • Open Access
1 Citations
1,294 Views
19 Pages

14 April 2026

The relentless miniaturization of semiconductor components and Printed Circuit Boards (PCBs) has rendered Automated Optical Inspection (AOI) of micro-defects a critical bottleneck in modern manufacturing and metrology. While in-line inspection system...

(This article belongs to the Special Issue Emerging Technologies and Applications for Semiconductor Industry)