Advances in Portable 3D Measurement

Dear Colleagues,

This Special Edition of Metrology will focus on advances and the state of the art in portable 3D measurements. This part of the 3D measurement and metrology spectrum is closely associated with the manufacture of large objects such as cars, aircraft, and ships as well as large scientific infrastructure such as telescopes and particle accelerators. However, the scalable nature of many of these portable measurement technologies also enables the accurate modeling of small objects such as museum artefacts and features such as surface damage. They can further be integrated into production lines where they collect large amounts of 3D data for the effective analysis of production methods.

The development and application of portable 3D measurement technologies has been growing since the 1970s, and they have had a significant impact on diverse fields such as manufacturing, construction, and heritage recording. Development continues with no obvious plateau in sight. This is an interesting, exciting, and challenging field for researchers, developers, and end users, and this new journal will contribute to that process.

Dr. Stephen Kyle
Prof. Dr. Stuart Robson
Prof. Ben Hughes
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-anonymized peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.