Advanced Fault Detection, Diagnosis and Control in Industrial Electronics

Dear Colleagues,

The challenges produced by pollution because of climate change have prompted society to explore alternative energy sources, particularly clean energy sources. New engineering and industry standards are also present; thus, it is essential to overcome some significant obstacles. Examples of some of them include reducing energy usage and emissions, improving human quality of life, and meeting industrial improvement demands. These facts demand specific attention from researchers and technological professionals, who must work to change the circumstance and prevalence pattern in cases like the ones listed above. Even though they are incredibly important to successfully resolve most problems, traditional procedures frequently have limits. New cutting-edge developments are therefore necessary.

This Special Issue provides an exciting forum for discussion of the most recent developments and practical uses of Advanced Fault Detection, Diagnosis, and Control in Industrial Electronics.

The following areas are among those that this Special Issue hopes to advance:

• diagnosis and fault identification;
• updating conventional systems;
• the development of novel intelligent control topologies and methodologies;
• modeling complex systems;
• process and method improvement;
• applications of intelligent systems to industrial operations;
• optimization of and increase in system performance;
• uses of intelligent systems;
• applications for intelligent controls;
• applications for smart grids and micro-grids;
• applications for electro-mobility and mobility;
• applied power electronics;
• Internet of Things.

Technical Program Committee Members:

1. Álvaro Michelena Grandío University of A Coruña
2. Míriam Timiraos Díaz University of A Coruña
3. Esteban Jove University of A Coruña
4. Héctor Quintián University of A Coruña
5. José Luis Casteleiro-Roca University of A Coruña
6. Víctor López University of A Coruña

Dr. Jose Luis Calvo-Rolle
Dr. Francisco Zayas-Gato
Guest Editors

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