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Application of Artificial Neural Network in Non-destructive Testing

This special issue belongs to the section "Networks".

Special Issue Information

Keywords

  • modeling
  • optimization
  • metaheuristic algorithms
  • computational intelligence
  • non-destructive testing
  • radiographic testing
  • electromagnetic testing
  • visual testing
  • ultrasonic testing
  • acoustic emission
  • artificial neural network
  • artificial intelligence
  • MPFM application

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Published Papers

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Electronics - ISSN 2079-9292