Microwave and Millimeter-Wave Imaging and Sensing: Advances in Devices, Signal Processing and Emerging Applications

Dear Colleagues,

Microwave and millimeter-wave imaging and sensing technologies have been applied across a wide range of scales, from dielectric characterization of materials and biological samples to the inspection and monitoring of large-scale structures and environments. The advantages of microwave and millimeter wave technologies in non-contact operation and sensitivity to electromagnetic properties make them well-suited to sensing and imaging in complex environments, with applications in industrial inspection, biomedical sensing, security screening, and remote sensing.

Moving from laboratory research to practical applications requires not only advances in individual device performance, but also targeted design based on the specific requirements of each application. Different applications impose varying requirements on at each stage of the sensing and imaging process, from sensor and antenna design to signal acquisition and data processing. Changes in environmental conditions and the inherent instability of monitoring targets can pose significant challenges to measurement accuracy and system stability. Addressing these issues calls for application-oriented advances at each technical stage, with designs and methods tailored to specific measurement scenarios and practical requirements.

This Special Issue aims to present recent advances in microwave and millimeter-wave imaging and sensing, with particular emphasis on technologies developed in response to real-world application needs. We welcome contributions covering sensing devices and fabrication, radar and microwave sensing architectures, signal processing, imaging and reconstruction algorithms, parameter estimation and inverse methods, and experimental studies in practical or application-relevant environments.

Topics of interest include, but are not limited to, the following:

• Microwave and millimeter-wave sensors;
• Sensor fabrication, packaging, and integration;
• Microwave and millimeter-Wave Radar;
• Microwave and millimeter measurement systems;
• Signal processing and reconstruction methods;
• Parameter estimation and electromagnetic inversion;
• Nondestructive testing and material characterization;
• Application-driven design and experimental validation.

We welcome the contribution of original research articles and review papers that advance microwave and millimeter-wave imaging and sensing through innovations in devices, hardware, processing, inversion, and application-oriented methodologies.

Dr. Xinyue Song
Dr. Yunan Han
Dr. Li Wang
Dr. Xiue Bao
Guest Editors

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