Measuring by Light: Innovations in Optical Measurement and Sensing for Advanced Metrology
A special issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: 15 December 2025 | Viewed by 68
Special Issue Editors
Interests: optical measurement techniques; metrology; laser Doppler vibrometry; optical fiber sensors; computer vision; machine vision; digital image correlation; non-destructive testing
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Optical measurement techniques are transforming metrology by providing high-precision, non-contact, and real-time sensing solutions across diverse applications. The increasing demand for reliable, automated, and scalable measurement systems has driven the development of advanced optical methodologies, including laser-based techniques, thermographic imaging, fiber optic sensing, and AI-driven data analysis. These innovations support enhanced accuracy, repeatability, and metrological traceability in scientific, industrial, and environmental monitoring contexts.
This Special Issue aims to showcase cutting-edge research on optical metrology, spanning theoretical advancements, experimental developments, and real-world applications. Topics of interest include, but are not limited to, the following:
- Non-contact optical sensing and imaging techniques;
- Laser-based measurement and interferometry;
- Optical metrology in structural health monitoring and industrial quality control;
- Integration of AI and machine learning in optical measurement;
- Traceability, calibration, and uncertainty quantification in optical systems;
- Emerging trends in fiber optic, quantum, and photonic sensors.
This Special Issue welcomes original research articles, experimental case studies, and comprehensive reviews that contribute to the advancement of optical metrology and its applications.
Prof. Dr. Steve Vanlanduit
Dr. Yuanchen Zeng
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- optical metrology
- laser-based measurement
- non-destructive optical inspection
- infrared and thermal imaging
- fiber optic sensing
- machine learning in optical measurement
- structural health monitoring
- traceability and calibration in metrology
- photonic and quantum sensors
- measurement uncertainty and data processing
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