Feature Papers Collection: Celebration of the First Impact Factor of Metrology
A special issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: 1 May 2026 | Viewed by 101
Special Issue Editors
Interests: dimensional metrology; interferometry; surface roughness; surface filtering
Special Issues, Collections and Topics in MDPI journals
Interests: modelling, simulation and data analysis in metrology; uncertainty quantification; inverse problems; virtual experiments/digital twins; machine learning; complex systems; fluid dynamics; computational optics; biological physics; active matter
Special Issues, Collections and Topics in MDPI journals
Interests: metrology; surface analysis; quantum technology
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
It is our great pleasure to announce that Metrology (ISSN 2673-8244) has received its first Impact Factor of 1.5, as published in the 2025 Edition of Journal Citation Reports® (Clarivate), released in June 2025.
To celebrate this wonderful achievement, we are launching this Special Issue to publish top-quality papers from Editorial Board Members and leading researchers who have been invited to submit their work by the Editorial Team. Papers could be both feature-length research papers and review papers describing the current state of the art in one of the subject areas covered by the journal. All papers will be published in open access and free of charge.
If you are interested in publishing your work in this Special Issue, please contact us or the Editorial Office.
Prof. Dr. Han Haitjema
Prof. Dr. Markus Bär
Prof. Dr. Samanta Piano
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- accuracy
- traceability
- uncertainty
- new SI (the International System of Units)
- quantum standards
- AI in metrology
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