Advances in Optical 3D Metrology

Dear Colleagues,

The topic of Optical 3D Metrology (O3DM) tackles precise 3D measurements and accurate modelling from imaging and range sensors. Research on Optical 3D Metrology investigates open issues concerning detailed 3D reconstructions in fields including industrial inspections, aerospace and automotive design, material and component testing, scene documentation, motion analysis, medical applications, and the exploration of remote and hazardous sites, to name but a few examples.

This Special Issue stems from the ISPRS Optical 3D Metrology workshop (https://o3dm.fbk.eu), which involves a series of biannual conferences that build upon the heritage of SPIE Videometrics (1991–2017) and Optical 3D Measurement Techniques (1989–2009). The two previous editions of this O3DM workshop were held in Strasbourg (France) in December 2019 and in Wuerzburg (Germany) in December 2022.

Topics of interest include, but are not limited to, the following:

• optical sensor investigations and characterisation;
• radiometric and geometric calibration of sensors;
• sensor/data fusion;
• the quality and calibration of colour for 3D models acquired using optical and range-sensing techniques;
• algorithms for precise 3D data derivation and processing;
• ambiguous sequences in image orientation;
• hybrid adjustments for high-accuracy applications;
• AI methods in metrology and industrial inspections;
• the handling of transparent or reflective surfaces.

For this Special Issue, we are seeking innovative contributions in the form of extended and improved versions of the articles that were presented at the aforementioned workshops. The accepted papers will be published as peer-reviewed articles in Metrology.

Dr. Giorgio Vassena
Prof. Dr. Fabio Remondino
Prof. Dr. Mark Shortis
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• photogrammetry
• active sensors
• sensor calibration
• bundle adjustment
• quality control
• accuracy