Metrological Traceability
A special issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: 31 May 2025 | Viewed by 280
Special Issue Editor
Special Issue Information
Dear Colleagues,
Metrologically traceable measurements are essential when important societal decisions are based on physical data. The rigor provided by traceable measurement is crucial for making robust, reliable, trustworthy decisions. But what exactly is traceable measurement, and how can it be represented in digital form? These questions now concern many people working towards the digital transformation of measurement infrastructures.
A recent workshop stimulated discussion on this important topic. Organized by the CIPM Forum on Metrology and Digitalization, in partnership with several technical committees of IMEKO, the workshop examined traceability in today’s measurement infrastructure, which is built on principles established in the late 20th century. The workshop also explored traceability for new and emerging measurement system technologies, including intrinsic standards, sensor networks, virtual measuring systems, and virtual data spaces.
This Special Issue offers a platform for further and more detailed exchanges of ideas on these topics. Submissions are invited that shed light on the challenges posed by traceable measurement and its representation in the broader context of the digital transformation of the international measurement system.
Dr. Blair Hall
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- metrological traceability
- measurement standard
- measurement uncertainty
- quality infrastructure
- calibration
- digitalization
- digital transformation
Benefits of Publishing in a Special Issue
- Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
- Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
- Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
- External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
- e-Book format: Special Issues with more than 10 articles can be published as dedicated e-books, ensuring wide and rapid dissemination.
Further information on MDPI's Special Issue polices can be found here.
