Advancements in Optical Measurement Devices and Technologies

A special issue of Metrology (ISSN 2673-8244).

Deadline for manuscript submissions: 25 January 2025 | Viewed by 1955

Special Issue Editors


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Guest Editor
Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Via Ponzio 34/5, 20133 Milano, Italy
Interests: optical sensors; interferometry; optoelectronics; optical measurements
Special Issues, Collections and Topics in MDPI journals

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Guest Editor
Department of Engineering, Tech Park, Bognor Regis Campus, University of Chichester, Bognor Regis PO21 1HR, UK
Interests: optics; sensor technology; electronic sensors; optical fibres

Special Issue Information

Dear Colleagues,

We propose a Special Issue on "Advancements in Optical Measurement Devices and Technologies" for the Metrology journal. Optical measurement technologies have become critical in various scientific and industrial applications due to their high precision, non-invasive nature, and versatility. This Special Issue aims to gather cutting-edge research and developments in this dynamic field, exploring novel optical measurement devices, innovative sensing techniques, and their applications.

Topics of interest include, but are not limited to, the following:

  • Novel Optical Sensors and Devices: Innovations in sensor design for enhanced sensitivity, selectivity, and stability.
  • Fiber Optic Sensing Technologies: Advances in fiber optic sensors for environmental, biomedical, and industrial applications.
  • Laser-Based Measurement Techniques: Developments in laser interferometry, laser Doppler velocimetry, and laser-induced fluorescence.
  • Imaging and Spectroscopy: Progress in optical imaging systems, spectroscopy methods, and their integration into measurement technologies.
  • Applications in Metrology: Case studies and reviews on the application of optical measurement technologies in metrology, including calibration, standardization, and quality control.

This Special Issue will provide a platform for researchers and practitioners to share their latest findings, promote interdisciplinary collaboration, and highlight the impact of optical measurement technologies on advancing precision measurement and metrology standards.

We invite contributions from academia, industry, and research institutions to submit original research articles, review papers, and case studies.

Prof. Dr. Michele Norgia
Dr. Rahul Kumar
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • optical sensors
  • fiber optic sensing
  • laser interferometry
  • spectroscopy
  • lidar
  • frequency comb
  • biophotonics
  • optical imaging
  • laser doppler velocimetry
  • environmental sensing
  • biomedical applications
  • precision metrology
  • measurement technologies

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Published Papers (3 papers)

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Research

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11 pages, 2728 KiB  
Article
Reflectivity Thresholds and Optical Loss Predictions in Resonant Photonic Cavities
by Paulo Henrique Dias Ferreira, Douglas Ramos do Amaral, Vinicius Tribuzi, John Fredy Ricardo Marroquin, Jorlandio Francisco Felix and Filippo Ghiglieno
Metrology 2024, 4(4), 765-775; https://doi.org/10.3390/metrology4040044 - 11 Dec 2024
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Abstract
Minimizing optical losses in resonant cavities is crucial for improving photonic device performance. This study focuses on the development of a simulation tool to analyze scattering losses in Fabry–Pérot interferometers (FPIs), offering precise modeling of waveguide dynamics and contributing to accurate loss predictions [...] Read more.
Minimizing optical losses in resonant cavities is crucial for improving photonic device performance. This study focuses on the development of a simulation tool to analyze scattering losses in Fabry–Pérot interferometers (FPIs), offering precise modeling of waveguide dynamics and contributing to accurate loss predictions across various platforms. Optical cavities often suffer from scattering losses due to surface roughness and material defects. Our approach integrates theoretical models and simulations to quantify these losses, utilizing the FPI as a model system. We identified upper and lower reflectivity thresholds, beyond which accurate measurement of losses becomes unreliable. For reflectivity below a certain threshold, measurement errors arise, while excessively high reflectivity can reduce fringe visibility and introduce detector sensitivity issues. Simulations were used to validate the model’s ability to predict reflectivity and attenuation in waveguides with varying loss levels. The software’s flexibility to adjust transmission parameters for different cavity configurations enhances its utility for a broad range of photonic systems. Our study offers a novel methodology for optical loss analysis, with practical applications in optimizing photonic devices. By providing a reliable tool for precise loss measurement, this work supports advancements in optical technologies, enabling the design of more efficient, high-performance devices across various applications. Full article
(This article belongs to the Special Issue Advancements in Optical Measurement Devices and Technologies)
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22 pages, 15709 KiB  
Article
Investigation of the Measurement Systems’ Suitability for the Non-Destructive Measurement of Complex Polymer-Based Micro and Nanostructures
by Selina Burkert, Lukas Schwörer, Tim Schubert, Jana Grundmann, David Stein and Andreas Heinrich
Metrology 2024, 4(4), 673-694; https://doi.org/10.3390/metrology4040040 - 21 Nov 2024
Viewed by 502
Abstract
In the fabrication of optical polymer-based components, such as diffractive gratings and waveguides, high throughput and high precision are required. The non-destructive evaluation of these complex polymer-based structures is a significant challenge. Different measurement techniques can measure the structure geometry directly or via [...] Read more.
In the fabrication of optical polymer-based components, such as diffractive gratings and waveguides, high throughput and high precision are required. The non-destructive evaluation of these complex polymer-based structures is a significant challenge. Different measurement techniques can measure the structure geometry directly or via its functionality indirectly. This study investigates various measurement techniques aimed at assessing these structures from 200 nm up to 20 µm. Environmental scanning electron microscopy (ESEM), white light interferometry (WLI), atomic force microscopy (AFM), micro computed tomography (µCT), optical coherence tomography (OCT), phase contrast microscopy (PCM), and Mueller matrix ellipsometry (MME) are investigated for their practical limits of lateral resolution and aspect ratio. The impact of the specimens’ complexity factors, including structure width and aspect ratio, on measurement quality is discussed. A particular focus of this study is on the suitability of different measurement systems for evaluating undercuts and enclosed structures while considering structure size, slant angle, and cover thickness. The aim is to discuss the specific advantages of the individual measurement systems and their application areas in order to be able to quickly select suitable measurement systems for a non-destructive evaluation of polymer-based micro and nanostructures. Full article
(This article belongs to the Special Issue Advancements in Optical Measurement Devices and Technologies)
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Review

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29 pages, 25007 KiB  
Review
Advancing Molecular Spectroscopy Efficiency with Extensive Parallelism
by Jiaqi Li, Rodrigo Fernandez, Bernardo Gutierrez, Jan Pedersen and Yan Zhou
Metrology 2024, 4(4), 736-764; https://doi.org/10.3390/metrology4040043 - 5 Dec 2024
Viewed by 725
Abstract
Molecular spectroscopy, with a legacy spanning over a century, has profoundly enriched our understanding of the microscopic world, driving major advancements across science and engineering. Over time, this field has steadily advanced, incorporating innovations such as lasers and digital computers to reach new [...] Read more.
Molecular spectroscopy, with a legacy spanning over a century, has profoundly enriched our understanding of the microscopic world, driving major advancements across science and engineering. Over time, this field has steadily advanced, incorporating innovations such as lasers and digital computers to reach new levels of precision and sensitivity. Over the past decade, the integration of high-speed embedded electronic systems and advanced light sources has ushered molecular spectroscopy into a new era, characterized by extensive parallelism and enhanced sensitivity. This review delves into two pioneering technologies that embody recent advancements in molecular spectroscopy: Chirped-Pulse Fourier Transform Microwave (CP-FTMW) spectroscopy and optical frequency comb (OFC) spectroscopy. We provide an overview of the fundamental principles behind these methods, examine their most impactful applications across diverse fields, and discuss their potential to drive future developments in molecular spectroscopy. By highlighting these technologies, we aim to underscore the transformative impact of integrating high-speed digital electronics and advanced light sources with molecular spectroscopy, enabling extensive parallelism and paving the way for groundbreaking discoveries and innovations in this rapidly evolving field. Full article
(This article belongs to the Special Issue Advancements in Optical Measurement Devices and Technologies)
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