In-Situ X-Ray Tomographic Study of Materials
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (31 December 2018) | Viewed by 88948
Special Issue Editors
Interests: materials science; X-Ray imaging; computed tomography; cellular materials
Interests: X -ray tomography; materials science
Special Issue Information
Dear Colleagues,
X-ray computed tomography has advanced significantly over recent years, both in terms of spatial resolution and image acquisition time. This has opened the way for a plethora of in situ studies, capturing a wide range of phenomena from the very quick to processes, which take place over many months. Many of the short timescale studies lie within the domain of synchrotron X-ray imaging with the longer timescales more focused on laboratory imaging.
Papers for this Special Issue of Materials, entitled "In-Situ X-Ray Tomographic Study of Materials" are invited that cover all aspects of in situ imaging from manufacturing processes (e.g., powder metallurgy, welding, solidification, additive manufacturing) to degradation under in operando service conditions (e.g., impact, tensile, corrosion, etc), from the perfusion of fluids through porous structures (e.g., fuel cells and batteries, petrological, bioscaffolds) to the behaviour of granular solids, across a very wide range of length and time scales, as well as materials. You are welcome to focus primarily on the in situ environments (thermal, mechanical, chemical, etc.) or on the phenomena that are being characterised and understood.
Full papers, communications, and reviews are all welcome.
Dr. Eric MaireDr. Jerome Adrien
Prof. Philip John Withers
Guest Editors
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Keywords
- X-ray computed tomography (CT)
- In-situ experiments
- Synchrotron imaging
- laboratory imaging
- manufacturing processes
- material behaviour
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Related Special Issue
- Materials Characterizations Using In-Situ Techniques in Materials (8 articles)