- Article
DOF Enhanced via the Multi-Wavelength Method for the Moiré Fringe-Based Alignment
- Kairui Zhang,
- Haifeng Sun,
- Dajie Yu,
- Song Hu,
- Junbo Liu and
- Ji Zhou
Alignment systems are core subsystems of lithography, which directly affect the overlay accuracy of the lithography process. The Moiré fringe-based alignment method has the advantages of high precision and low complexity. However, the precisio...

