Advanced Measurement Instruments and Metrological Frameworks for Emerging Intelligent Technologies

Dear Colleagues,

The rapid convergence of artificial intelligence (AI), extended reality (XR), digital twins, neurotechnologies, robotics, and intelligent sensing systems is reshaping modern scientific, industrial, and societal applications. These technologies increasingly rely on complex measurement infrastructures, advanced instrumentation, and data-driven methodologies whose performance, reliability, and trustworthiness must be rigorously assessed. As emerging intelligent systems become deeply integrated into healthcare, manufacturing, education, transportation, cultural heritage, and smart environments, metrology assumes a strategic role in ensuring measurement quality, system validation, traceability, interoperability, and regulatory compliance. The development of robust instruments and measurement methodologies is essential for translating technological innovation into safe, effective, and reproducible real-world solutions. This Special Issue aims to collect high-quality contributions presented at and inspired by IEEE MetroXRAINE 2026, as well as original research from the broader scientific community, addressing the design, characterization, validation, and application of innovative measurement instruments and systems for emerging intelligent technologies. Particular attention will be devoted to advanced sensing architectures, AI-assisted measurement systems, XR-based experimental platforms, neuroengineering instrumentation, digital twins, cyber–physical systems, and human-centered measurement approaches. Contributions addressing uncertainty evaluation, performance benchmarking, metrological traceability, standardization, explainability, and trustworthiness of intelligent systems are especially welcome. The Special Issue encourages interdisciplinary research combining instrumentation science, applied metrology, signal processing, machine learning, human factors, and system validation methodologies. Studies involving experimental validation, novel measurement protocols, benchmarking frameworks, and applications in real-world environments are particularly encouraged. 

Topics include, but are not limited to, the following:

• Advanced instrumentation for emerging intelligent technologies;
• Measurement science and metrology for AI-enabled systems;
• Validation and benchmarking methodologies for machine learning and generative AI applications;
• XR, AR, MR, and VR measurement systems and performance characterization;
• Digital twins and metrological frameworks for virtual and hybrid environments;
• Brain-computer interfaces and neuroengineering instrumentation;
• Human-centered measurement approaches, including usability, workload, cognitive, behavioral, and physiological assessment;
• Intelligent sensors, wearable devices, and embedded measurement systems;
• Data acquisition, sensor fusion, and real-time signal processing architectures;
• Robotics, autonomous systems, and cyber–physical measurement platforms;
• Explainability, transparency, and trustworthiness assessment of AI systems;
• Uncertainty evaluation and propagation in complex measurement systems;
• Interoperability, standardization, and benchmarking of advanced instrumentation;
• Measurement methodologies for sustainability assessment and environmental monitoring;
• Ethical, legal, and regulatory aspects of intelligent measurement systems;
• Applications of metrology in healthcare, industry, education, cultural heritage, and smart environments.

Prof. Dr. Olfa Kanoun
Dr. Leila Es Sebar
Dr. Marisa Pesola
Guest Editors

Manuscript Submission Information

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