AI for Instruments and Metrology for AI

This section explores the transformative, two-way relationship between artificial intelligence and instrumentation. "AI for Instruments" covers the application of machine learning, deep learning, and data analytics to enhance instrument capabilities, including automated operation, intelligent calibration, predictive maintenance, noise reduction, and advanced data interpretation (e.g., AI-driven microscopy or spectroscopy or Tiny ML/Edge AI for microcontroller-based transducers). A special emphasis is placed on advanced instrumentation based on AI for characterizing next-generation semiconductors, neuromorphic chips, and sensors. "Metrology for AI" addresses measurement science and technology, including related benchmarks and measurement methods, to validate and characterize metrological AI algorithms and software, to achieve appropriate levels of accuracy, robustness, and cybersecurity.