Advancements in Optical Measurement Devices and Technologies

Dear Colleagues,

We propose a Special Issue on "Advancements in Optical Measurement Devices and Technologies" for the Metrology journal. Optical measurement technologies have become critical in various scientific and industrial applications due to their high precision, non-invasive nature, and versatility. This Special Issue aims to gather cutting-edge research and developments in this dynamic field, exploring novel optical measurement devices, innovative sensing techniques, and their applications.

Topics of interest include, but are not limited to, the following:

• Novel Optical Sensors and Devices: Innovations in sensor design for enhanced sensitivity, selectivity, and stability.
• Fiber Optic Sensing Technologies: Advances in fiber optic sensors for environmental, biomedical, and industrial applications.
• Laser-Based Measurement Techniques: Developments in laser interferometry, laser Doppler velocimetry, and laser-induced fluorescence.
• Imaging and Spectroscopy: Progress in optical imaging systems, spectroscopy methods, and their integration into measurement technologies.
• Applications in Metrology: Case studies and reviews on the application of optical measurement technologies in metrology, including calibration, standardization, and quality control.

This Special Issue will provide a platform for researchers and practitioners to share their latest findings, promote interdisciplinary collaboration, and highlight the impact of optical measurement technologies on advancing precision measurement and metrology standards.

We invite contributions from academia, industry, and research institutions to submit original research articles, review papers, and case studies.

Prof. Dr. Michele Norgia
Dr. Rahul Kumar
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-anonymized peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.