Editor’s Choice Articles

Editor’s Choice articles are based on recommendations by the scientific editors of MDPI journals from around the world. Editors select a small number of articles recently published in the journal that they believe will be particularly interesting to readers, or important in the respective research area. The aim is to provide a snapshot of some of the most exciting work published in the various research areas of the journal.

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12 pages, 1863 KB  
Article
Towards the Development of an Optical Quantum Frequency Standard Feasible for a Medium-Size NMI
by Adriana Palos, Ismael Caballero, Daniel de Mercado, Yolanda Álvarez, David Peral and Javier Díaz de Aguilar
Metrology 2025, 5(4), 75; https://doi.org/10.3390/metrology5040075 - 8 Dec 2025
Viewed by 1742
Abstract
Centro Español de Metrología (CEM) is developing a quantum frequency standard based on trapped calcium ions, marking its entry into the landscape of the second quantum revolution. Optical frequency standards offer unprecedented precision by referencing atomic transitions that are fundamentally stable and immune [...] Read more.
Centro Español de Metrología (CEM) is developing a quantum frequency standard based on trapped calcium ions, marking its entry into the landscape of the second quantum revolution. Optical frequency standards offer unprecedented precision by referencing atomic transitions that are fundamentally stable and immune to environmental drift. However, the challenge of developing such a system from scratch is unaffordable for a medium-sized National Metrology Institute (NMI), which seems to limit the ability of an institute such as CEM to contribute to this field of research. To overcome this, CEM has adopted a hybrid strategy, combining commercially available components with custom integration to accelerate deployment. This paper defines and implements an architecture adapted to the constraints of a medium-size NMI, where the main contribution is the systematic design, selection, and interconnection of the subsystems required to realize this standard. The rationale behind the system design is presented, detailing the integration of key elements for ion trapping, laser stabilization, frequency measurement, and system control. Current progress, ongoing developments, and future research directions are outlined, establishing the foundation for spectroscopic measurements and uncertainty evaluation. The project represents a strategic step toward strengthening national capabilities in quantum metrology for a medium-sized NMI. Full article
(This article belongs to the Special Issue Advancements in Optical Measurement Devices and Technologies)
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22 pages, 529 KB  
Review
The Critical Role of International Comparisons in Global Metrology System: An Overview
by Patrice Salzenstein, Thomas Y. Wu and Ekaterina Pavlyuchenko
Metrology 2025, 5(4), 74; https://doi.org/10.3390/metrology5040074 - 3 Dec 2025
Cited by 3 | Viewed by 3043
Abstract
International comparisons play a critical role in ensuring precision, accuracy, consistency, and trust in the global metrology system. The Comité International des Poids et Mesures (CIPM) established the Mutual Recognition Arrangement (MRA) in 1999 to facilitate global trade. This paper gives an overview [...] Read more.
International comparisons play a critical role in ensuring precision, accuracy, consistency, and trust in the global metrology system. The Comité International des Poids et Mesures (CIPM) established the Mutual Recognition Arrangement (MRA) in 1999 to facilitate global trade. This paper gives an overview of the critical role of international comparisons to National Metrology Institutes (NMIs), industrial calibration laboratories, and research laboratories in fostering global measurement equivalence and the CIPM MRA. NMIs rely on Key and Supplementary Comparisons to ensure the mutual recognition of calibration and reference material certificates, vital for global trade and regulatory compliance. Industrial calibration laboratories participate in inter-laboratory or international comparisons to validate their calibration and measurement capability (CMC) and balance their risk management. Research laboratories push the frontiers of measurement science and validate their measurement result via international comparisons. Through some examples of comparisons, the paper illustrates how measurement result discrepancies uncovered in comparisons drive technical improvements, uncertainty component identification, and measurement technique refinement. International comparisons enhance scientific credibility, build public trust, support industrial innovation, and drive evolution in measurement science. As technological demands grow, fostering broader participation in international comparisons by various metrology and research laboratories remains crucial to maintain a robust and reliable global metrology system. Full article
(This article belongs to the Special Issue Applied Industrial Metrology: Methods, Uncertainties, and Challenges)
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21 pages, 3076 KB  
Article
Verification of Microprobe Calibration Based on Actual Diameter Measurement of the Probe Tip Sphere
by So Ito, Daichi Inukai, Takehiro Tomioka, Yasutomo Sugisawa, Kenta Matsumoto and Kazuhide Kamiya
Metrology 2025, 5(4), 73; https://doi.org/10.3390/metrology5040073 - 1 Dec 2025
Cited by 1 | Viewed by 1553
Abstract
In three-dimensional measurement using a microprobing system with a micrometric spherical tip, a deviation in the diameter of the probe tip sphere causes measurement errors. In a typical probing system calibration, the effective diameter of the probe tip sphere is estimated based on [...] Read more.
In three-dimensional measurement using a microprobing system with a micrometric spherical tip, a deviation in the diameter of the probe tip sphere causes measurement errors. In a typical probing system calibration, the effective diameter of the probe tip sphere is estimated based on the probing coordinates obtained on a calibration artifact with guaranteed dimensional accuracy. On the other hand, the calibration results of the effective diameter of the probe tip include uncertainty sources derived from errors inherent to the calibration artifacts and probing system itself, which cannot be eliminated. In this study, a micro-stylus with a tip sphere having a diameter less than 25 μm was fabricated. The actual diameter of its tip sphere was measured based on the contour form obtained along with the high-precision plane. The effective diameter of the same microprobe tip sphere was also measured by probing inside the precision micro-slit constructed with three gauge blocks. The measurement uncertainties of the actual and effective diameters were calculated and compared to each other. The measurement uncertainty of the actual diameter of the microprobe tip sphere based on the contour form measurement was confirmed to be smaller than that of the effective diameter measurement uncertainty, as it did not include errors inherent in the probing system. Furthermore, because the difference between the actual and effective diameters was smaller than that of the measurement uncertainties, the effectiveness of measuring actual diameter in microprobe calibration has been demonstrated. Full article
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17 pages, 2718 KB  
Article
Metrology for Virtual Measuring Instruments Illustrated by Three Applications
by Sonja Schmelter, Ines Fortmeier and Daniel Heißelmann
Metrology 2025, 5(3), 54; https://doi.org/10.3390/metrology5030054 - 1 Sep 2025
Cited by 3 | Viewed by 3912
Abstract
In the course of digitalization, the importance of modeling and simulating real-world processes in a computer is rapidly increasing. Simulations are now in everyday use in many areas. For example, simulations are used to gain a better understanding of the real experiment, to [...] Read more.
In the course of digitalization, the importance of modeling and simulating real-world processes in a computer is rapidly increasing. Simulations are now in everyday use in many areas. For example, simulations are used to gain a better understanding of the real experiment, to plan new experiments, or to analyze existing experiments. Simulations are now also increasingly being used as an essential component of a real measurement, usually as part of an inverse problem. To ensure confidence in the results of such virtual measurements, traceability and methods for evaluating uncertainty are needed. In this paper, the challenges and benefits inherent to virtual metrology techniques are shown using three examples from different metrological fields: the virtual coordinate measuring machine, the tilted-wave interferometer, and the virtual flow meter. Full article
(This article belongs to the Special Issue Metrological Traceability)
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34 pages, 4238 KB  
Review
Optical Fringe Projection: A Straightforward Approach to 3D Metrology
by Rigoberto Juarez-Salazar, Sofia Esquivel-Hernandez and Victor H. Diaz-Ramirez
Metrology 2025, 5(3), 47; https://doi.org/10.3390/metrology5030047 - 3 Aug 2025
Cited by 9 | Viewed by 7957
Abstract
Optical fringe projection is an outstanding technology that significantly enhances three-dimensional (3D) metrology in numerous applications in science and engineering. Although the complexity of fringe projection systems may be overwhelming, current scientific advances bring improved models and methods that simplify the design and [...] Read more.
Optical fringe projection is an outstanding technology that significantly enhances three-dimensional (3D) metrology in numerous applications in science and engineering. Although the complexity of fringe projection systems may be overwhelming, current scientific advances bring improved models and methods that simplify the design and calibration of these systems, making 3D metrology less complicated. This paper provides an overview of the fundamentals of fringe projection profilometry, including imaging, stereo systems, phase demodulation, triangulation, and calibration. Some applications are described to highlight the usefulness and accuracy of modern optical fringe projection profilometers, impacting 3D metrology in different fields of science and engineering. Full article
(This article belongs to the Special Issue Advancements in Optical Measurement Devices and Technologies)
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13 pages, 617 KB  
Project Report
European Partnership in Metrology Project: Photonic and Quantum Sensors for Practical Integrated Primary Thermometry (PhoQuS-T)
by Olga Kozlova, Rémy Braive, Tristan Briant, Stéphan Briaudeau, Paulina Castro Rodríguez, Guochun Du, Tufan Erdoğan, René Eisermann, Emile Ferreux, Dario Imbraguglio, Judith Elena Jordan, Stephan Krenek, Graham Machin, Igor P. Marko, Théo Martel, Maria Jose Martin, Richard A. Norte, Laurent Pitre, Sara Pourjamal, Marco Queisser, Israel Rebolledo-Salgado, Iago Sanchez, Daniel Schmid, Cliona Shakespeare, Fernando Sparasci, Peter G. Steeneken, Tatiana Steshchenko, Stephen J. Sweeney, Shahin Tabandeh, Georg Winzer, Anoma Yamsiri, Alethea Vanessa Zamora Gómez, Martin Zelan and Lars Zimmermannadd Show full author list remove Hide full author list
Metrology 2025, 5(3), 44; https://doi.org/10.3390/metrology5030044 - 19 Jul 2025
Viewed by 2928
Abstract
Current temperature sensors require regular recalibration to maintain reliable temperature measurement. Photonic/quantum-based approaches have the potential to radically change the practice of thermometry through provision of in situ traceability, potentially through practical primary thermometry, without the need for sensor recalibration. This article gives [...] Read more.
Current temperature sensors require regular recalibration to maintain reliable temperature measurement. Photonic/quantum-based approaches have the potential to radically change the practice of thermometry through provision of in situ traceability, potentially through practical primary thermometry, without the need for sensor recalibration. This article gives an overview of the European Partnership in Metrology (EPM) project: Photonic and quantum sensors for practical integrated primary thermometry (PhoQuS-T), which aims to develop sensors based on photonic ring resonators and optomechanical resonators for robust, small-scale, integrated, and wide-range temperature measurement. The different phases of the project will be presented. The development of the integrated optical practical primary thermometer operating from 4 K to 500 K will be reached by a combination of different sensing techniques: with the optomechanical sensor, quantum thermometry below 10 K will provide a quantum reference for the optical noise thermometry (operating in the range 4 K to 300 K), whilst using the high-resolution photonic (ring resonator) sensor the temperature range to be extended from 80 K to 500 K. The important issues of robust fibre-to-chip coupling will be addressed, and application case studies of the developed sensors in ion-trap monitoring and quantum-based pressure standards will be discussed. Full article
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16 pages, 5307 KB  
Article
Revisiting an Indentation Method for Measuring Low Wear Rates Using 3D Interferometry
by Gabriela R. Piazzetta, Thomas M. Zeller, Juan M. Hernandez-Otalvaro and Giuseppe Pintaude
Metrology 2025, 5(2), 35; https://doi.org/10.3390/metrology5020035 - 8 Jun 2025
Cited by 3 | Viewed by 2236
Abstract
Predicting the wear of disc cutters in Tunnel Boring Machines (TBMs) is a complex challenge due to the large scale of the machinery and the numerous operational variables involved. Laboratory-scale tests offer a controlled approach to isolating and analyzing specific wear mechanisms. However, [...] Read more.
Predicting the wear of disc cutters in Tunnel Boring Machines (TBMs) is a complex challenge due to the large scale of the machinery and the numerous operational variables involved. Laboratory-scale tests offer a controlled approach to isolating and analyzing specific wear mechanisms. However, the extremely low wear rates observed in such simulations pose challenges for conventional characterization methods, as gravimetric and profilometric techniques often lack the precision and accuracy needed to measure low wear patterns with an uneven morphology. To address this, this study revisited a methodology for quantifying low wear rates in a reciprocating wear test using AISI H13 tool steel disc cutters. This approach integrates spherical indentation marks as reference points with 3D white-light interferometry, enabling high-precision material loss measurements. Eighteen disc samples were subjected to wear testing, with 3 indentations analyzed per sample, for a total of 54 indentations. The statistical validation confirmed the method’s reproducibility and reliability. The proposed approach provides a robust alternative to existing techniques, addressing a critical gap regarding the accurate quantification of low wear rates in controlled laboratory settings. Full article
(This article belongs to the Special Issue Advances in Optical 3D Metrology)
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13 pages, 2221 KB  
Article
Investigation and Improvement of Inconsistency in Surface-Form Measurement Results Due to Difference of Incident Direction of Measuring Light in Abramson-Type Oblique-Incident Interferometer
by So Ito, Takumi Yamagishi, Kimihisa Matsumoto and Kazuhide Kamiya
Metrology 2025, 5(2), 34; https://doi.org/10.3390/metrology5020034 - 7 Jun 2025
Viewed by 1923
Abstract
An Abramson-type oblique-incident interferometer was used for the surface-form measurement of hand-scraped marks consisting of rough surfaces. Although the Abramson interferometer could measure the rough surface of hand-scraped marks under noncontact conditions, the inconsistency in the measurement results was caused by the differences [...] Read more.
An Abramson-type oblique-incident interferometer was used for the surface-form measurement of hand-scraped marks consisting of rough surfaces. Although the Abramson interferometer could measure the rough surface of hand-scraped marks under noncontact conditions, the inconsistency in the measurement results was caused by the differences in the incident direction of the measuring light. This study investigated the inconsistency in the measurement results of the Abramson interferometer caused by the oblique incidence of the measuring light. The reproducibility of inconsistencies due to the difference in the incident direction of the measuring light was confirmed, and the relationship between the inconsistency of the measurement results and the incident angle of the measuring light was investigated. Consequently, it was confirmed that the inconsistency of the measurement results due to the difference in the incident direction of the measuring light could be reduced by decreasing the incident angle of the measuring light. To avoid the overcrowding of the interference fringes caused by the reduction in the incident angle of the measuring light, an oblique-incident interferometer with a near-infrared laser was constructed. The validity of the developed oblique-incident interferometer was evaluated by comparison with a commercially available contour measurement instrument. The surface form obtained by the developed oblique-incident interferometer was confirmed to be consistent with the envelope of the cross-sectional profile measured by the contour measurement instrument. Full article
(This article belongs to the Special Issue Advancements in Optical Measurement Devices and Technologies)
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8 pages, 190 KB  
Communication
The Silent Benefactor: Why Explaining the Importance of Metrology Involves Addressing the Counterfactual
by Richard J. C. Brown and Paul J. Brewer
Metrology 2025, 5(2), 27; https://doi.org/10.3390/metrology5020027 - 8 May 2025
Cited by 2 | Viewed by 2210
Abstract
Metrology, the science of measurement, is an essential underpinning technology—an infratechnology. The correct functioning of the international measurement system that metrology supports is a prerequisite for the development of technology and wider progress in science. Metrology and the measurement system are at risk [...] Read more.
Metrology, the science of measurement, is an essential underpinning technology—an infratechnology. The correct functioning of the international measurement system that metrology supports is a prerequisite for the development of technology and wider progress in science. Metrology and the measurement system are at risk of being underappreciated. They potentially face a ‘no-win’ environment: their consistent success, a testament to their effectiveness, ironically leads to invisibility. The public and media tend only to pay attention when things go wrong, resulting in negative headlines. Furthermore, metrology’s emphasis on gradual, incremental improvements, crucial for maintaining long-term stability and safety, is incompatible with the short-term focus of the media. This leaves metrology perpetually struggling to gain recognition for its vital contributions and can lead to a danger that metrology will not receive the recognition or resources that it needs to continue delivering benefits. A different way of explaining the indispensability of metrology is therefore needed. This work takes a novel approach to explaining the benefits of metrology by considering the counterfactual argument—examining the consequences if the international measurement system was to fail. It concludes that a balanced argument demonstrating what benefits metrology provides, challenged with the counterfactual of what would happen if it did not, is likely to be the most effective mechanism to ensure the work of metrology and the indispensability of the international measurement system are properly appreciated. Full article
14 pages, 10293 KB  
Article
Imaging Techniques for 3-Dimensional, Non-Line-of-Sight Structures Fabricated in Silicon Carbide
by Jared E. Payne, Joseph Eddy, Hunter Stevenson, Gregory N. Nielson and Stephen Schultz
Metrology 2025, 5(1), 9; https://doi.org/10.3390/metrology5010009 - 2 Feb 2025
Cited by 1 | Viewed by 1950
Abstract
Advances in silicon carbide fabrication techniques enable the fabrication of high aspect ratio non-line-of-sight structures. The further development of non-line-of-sight fabrication tools and the use of the non-line-of-sight structures requires a set of measurement techniques. The goals of the measurement techniques are to [...] Read more.
Advances in silicon carbide fabrication techniques enable the fabrication of high aspect ratio non-line-of-sight structures. The further development of non-line-of-sight fabrication tools and the use of the non-line-of-sight structures requires a set of measurement techniques. The goals of the measurement techniques are to (1) quickly detect the success of the fabrication and determine when a failure occurs, (2) accurately measure the shape of the subsurface structure, and (3) accurately characterize the structure. The first goal is attained using subsurface optical microscopy and single point confocal microscopy with a demonstrated resolution of 3 μm. The second goal is attained using X-ray computer tomography with a resolution of 500 nm. The third goal requires the accuracy of scanning electron microscopy. The substructures are brought to the surface through focused ion beam milling if the structures are less than 30 μm deep and through ablation cleaving and polishing for deeper substructures. Full article
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20 pages, 5970 KB  
Article
Design and Realization of a Cutting Force Measuring System to Analyze the Chip Removal Process in Rotational Turning
by István Sztankovics
Metrology 2025, 5(1), 5; https://doi.org/10.3390/metrology5010005 - 12 Jan 2025
Cited by 5 | Viewed by 3804
Abstract
This study focuses on a detailed analysis of the cutting forces in rotational turning, a novel machining process designed to achieve high surface quality and productivity. Unlike traditional longitudinal turning, rotational turning employs a helical cutting-edged tool that performs a circular feeding movement, [...] Read more.
This study focuses on a detailed analysis of the cutting forces in rotational turning, a novel machining process designed to achieve high surface quality and productivity. Unlike traditional longitudinal turning, rotational turning employs a helical cutting-edged tool that performs a circular feeding movement, introducing complex kinematics that complicates the accurate measurement of the cutting forces. To address this, the theoretical background was described for modeling the cutting force removal. The process was experimentally simulated on a CNC milling machine using a custom-designed measurement system. The major cutting force, passive force, and feed force were successfully measured and analyzed under varying feed conditions for both rotational and longitudinal turning. The results demonstrate a significant reduction in the passive force during rotational turning compared to longitudinal turning, which directly contributes to lower elastic deformation in the radial direction of the workpiece. This reduction improves the dimensional accuracy and stability during machining. Additionally, the feed force was observed to be slightly higher in rotational turning, reflecting the influence of the rotational movement of the tool. These findings highlight the advantages of rotational turning for applications requiring precision and surface quality, particularly where radial deformation is a critical concern. This study establishes a reliable methodology for force measurement in rotational turning and provides valuable comparative insights into its performance relative to conventional turning processes. Full article
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20 pages, 2167 KB  
Article
Measurement Uncertainty Evaluation for Sensor Network Metrology
by Peter Harris, Peter Friis Østergaard, Shahin Tabandeh, Henrik Söderblom, Gertjan Kok, Marcel van Dijk, Yuhui Luo, Jonathan Pearce, Declan Tucker, Anupam Prasad Vedurmudi and Maitane Iturrate-Garcia
Metrology 2025, 5(1), 3; https://doi.org/10.3390/metrology5010003 - 9 Jan 2025
Cited by 11 | Viewed by 7141
Abstract
Sensor networks, which are increasingly being used in a broad range of applications, constitute a measurement paradigm involving ensembles of sensors measuring possibly different quantities at a discrete sample of spatial locations and temporal points outside the laboratory. If sensor networks are to [...] Read more.
Sensor networks, which are increasingly being used in a broad range of applications, constitute a measurement paradigm involving ensembles of sensors measuring possibly different quantities at a discrete sample of spatial locations and temporal points outside the laboratory. If sensor networks are to be considered as true metrology systems and the measurement results derived from them used for decision-making, such as in a regulatory context, it is important that the results are accompanied by reliable statements of measurement uncertainty. This paper gives a preview of some of the work undertaken within the European-funded ‘Fundamental principles of sensor network metrology (FunSNM)’ project to address the challenges of measurement uncertainty evaluation in some real-world sensor network applications. The applications demonstrate that sensor networks possess features related to the nature of the measured quantities, to the nature of the measurement model, and to the nature of the measured data. These features make conventional methods of measurement uncertainty evaluation, and established guidelines for measurement uncertainty evaluation difficult to apply. An overview of some of the modelling tools used to address the challenges of measurement uncertainty evaluation in those applications is given. Full article
(This article belongs to the Collection Measurement Uncertainty)
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