Advancements in Optical Measurement Devices and Technologies: 2nd Edition
A special issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: 15 November 2026 | Viewed by 147
Special Issue Editors
Interests: optical sensors; interferometry; optoelectronics; optical measurements
Special Issues, Collections and Topics in MDPI journals
Interests: optics; sensor technology; electronic sensors; optical fibres
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Following the success of the Special Issue “Advancements in Optical Measurement Devices and Technologies” for the journal Metrology (https://www.mdpi.com/journal/metrology/special_issues/01RZT1P1XN), we propose its second edition. Optical measurement techniques are now widespread and indispensable for various scientific and industrial applications. Their metrological characterization is becoming increasingly important, as are all aspects related to measurement methods. In parallel, the integration of artificial intelligence (AI) and machine learning (ML) is transforming measurement science by enabling enhanced data analysis, intelligent sensing, automated calibration and improved uncertainty estimation.
This Special Issue aims to gather cutting-edge research and developments in this dynamic field, exploring novel optical measurement devices and sensing techniques, their applications and their metrological characterization, including the growing role of AI-driven approaches.
Topics of interest include, but are not limited to, the following:
- Optical Sensors and Devices: Innovations in optical sensor design, including AI-enhanced sensing and metrological characterization of optical devices.
- Fiber Optic Sensing Technologies: Advances in fiber optic sensors for environmental, biomedical and industrial applications, including intelligent data interpretation methods.
- Laser-Based Measurement Techniques: Developments or new applications for laser interferometry, laser Doppler velocimetry and laser-induced fluorescence, incorporating AI for signal processing and noise reduction.
- Imaging and Spectroscopy: Progress in optical imaging systems, spectroscopy methods and their application to measurement purposes, including AI-based image reconstruction, feature extraction and quantitative analysis.
- Applications in Metrology: Case studies and reviews on the application of optical measurement technologies in metrology, including calibration, standardization, quality control and AI-assisted uncertainty evaluation.
This Special Issue will provide a platform for researchers and practitioners to share their latest findings, promote interdisciplinary collaboration and highlight the impacts of optical measurement technologies and AI-driven methods on advancing precision measurement and metrology standards.
We invite contributions from academia, industry and research institutions, with submissions of original research articles, review papers and case studies.
Prof. Dr. Michele Norgia
Dr. Rahul Kumar
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- optical sensors
- fiber optic sensing
- laser interferometry
- spectroscopy
- lidar
- frequency comb
- biophotonics
- optical imaging
- laser Doppler velocimetry
- environmental sensing
- biomedical applications
- precision metrology
- measurement technologies
- artificial intelligence
- machine learning
- data-driven metrology
- intelligent sensing
- sensor fusion
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Related Special Issue
- Advancements in Optical Measurement Devices and Technologies in Metrology (13 articles)
