Metrology

Metrology is an international, peer-reviewed, open access journal on the science and technology of measurement and metrology, published quarterly online by MDPI.
Impact Factor: 1.5 (2024); 5-Year Impact Factor: 1.6 (2024)
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Topic in Acoustics, Actuators, Applied Sciences, Instruments, Sensors, Metrology, NDT, AI Sensors
Industrial Instrument and Intelligent Measurement Topic Editors: Qibo Feng, Lisha Peng, Hongyu Sun, Luyao He, Xiang Gao
Deadline: 29 February 2028
Special Issue in Metrology
Measuring by Light: Innovations in Optical Measurement and Sensing for Advanced Metrology Guest Editors: Steve Vanlanduit, Yuanchen Zeng
Deadline: 15 June 2026
Special Issue in Metrology
Applied Industrial Metrology: Methods, Uncertainties, and Challenges Guest Editor: Patrice Salzenstein
Deadline: 25 June 2026
Special Issue in Metrology
Advances in Metrology for Artificial Intelligence and Neural Network Applications Guest Editors: Pedro M. Ramos, Egidio De Benedetto, Antonio Esposito
Deadline: 25 June 2026
Special Issue in Metrology
Estimation and Prediction of Coordinate Measurement Uncertainty: Recent Trends and Developments Guest Editors: Adam Gąska, Danuta Owczarek
Deadline: 15 October 2026
Topical Collection in Metrology
Measurement Uncertainty Collection Editor: Simona Salicone
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