Recent Developments in Fringe Pattern Analysis for Optics and Photonics

Dear Colleagues,

Interferometry is one of the most powerful and versatile techniques of measurement. It has driven great progress in science and technology for more than two hundred years, from its classical beginnings with Young, Fizeau, Michelson, Raleigh, and Sagnac (just to mention a few) to its modern version: digital interferometry or, in general, fringe pattern phase demodulation. Digital interferometry has brought a big boost to classical interferometry, pushing its boundaries on robustness, flexibility, and sensitivity using digital signal processing. Digital interferometry has made possible a new, wide range of applications and scientific breakthroughs: fast and cheap 3D digitizing, cryptography, photon entanglement, the first image of a black hole, the measurement of the mirrors of the James Webb telescope, and detection of gravitational waves. On the other hand, there are several important applications of fringe pattern phase demodulation in optical metrology, such as optical coherence tomography, fringe projection profilometry, speckle correlation, etc.

We are pleased to invite you to this Special Issue of Photonics focused on fundamentals and applications that reflect the most recent developments and trends in fringe pattern analysis for optics and photonics.

We are looking for contributions that show the tremendous importance and impact of this field, including (but not limited to) new theoretical and mathematical frameworks and applications on optical testing, interferometric fiber sensors, fringe analysis algorithms, fringe projection profilometry, AI-based fringe processing, phase unwrapping, and optical coherence tomography.

We hope that this Special Issue will provide a solid perspective and insight on this important and transcendental subject.

Dr. Manuel Servin
Dr. Gonzalo Paez
Dr. Moises Padilla
Guest Editors

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