Electron Microscopy of Semiconductor and Magnetic Materials

Dear Colleagues,

Electron microscopy is an indispensable tool for characterizing the microstructures of materials ranging from single crystals and polycrystals to amorphous systems. With recent advances in electron microscopy techniques, it is now possible to probe not only atomic and nanoscale structures but also functional properties such as magnetic configurations, internal electric fields, and local electrical resistivity. In addition, the development of in situ and operando methodologies enables direct observation of structural and property evolutions under external stimuli. This Special Issue aims to highlight recent progress in the application of electron microscopy to the study of semiconductor and magnetic materials, with a particular focus on structure–property relationships, emerging characterization techniques, and dynamic phenomena.

Dr. Sangmoon Yoon
Guest Editor

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