This paper presents a comprehensive register transfer-level (RTL) fault injection study targeting the program counter (PC) of the LEON3 processor, a SPARC V8-compliant core widely used in safety-critical and radiation-prone embedded applications. Usi...
This paper presents a register-transfer-level (RTL) fault injection study of the LEON3 processor’s internal memory subsystem under single-event upsets (SEUs). The analysis targets four key components: the instruction cache (I-cache), data cache...
The pre-silicon reliability analysis of digital integrated circuits relies on fault-injection campaigns to characterize how single-event upsets propagate into distinct system-level outcomes. Exhaustive gate-level injection is expensive, whereas most...
This work presents Quasar, an open-source tool developed to boost the characterization of how variability effects impact radiation sensitivity in digital circuits. Quasar receives a SPICE netlist as input and automatically determines robustness metri...
With the widespread deployment of SRAM-based FPGAs across multiple application scenarios, the soft error resilience of FPGAs has become critically important. To mitigate errors, current mainstream techniques either incur significant PPA (Performance,...