- Review
Spectroscopic Ellipsometry: Advancements, Applications and Future Prospects in Optical Characterization
- Grazia Giuseppina Politano and
- Carlo Versace
Spectroscopic ellipsometry (SE), a non-invasive optical technique, is a powerful tool for characterizing surfaces, interfaces, and thin films. By analyzing the change in the polarization state of light upon reflection or transmission through a sample...

