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Proceeding Paper

Measuring the Thickness of Metal Films: A Selection Guide to the Most Suitable Technique

1
Department of Chemistry “Ugo Schiff”, Università degli Studi di Firenze, via della Lastruccia 3, 50019 Sesto Fiorentino (FI), Italy
2
Institute of Chemistry of Organometallic Compounds (ICCOM)—National Research Council (CNR), Via Madonna del Piano 10, 50019 Sesto Fiorentino (FI), Italy
*
Authors to whom correspondence should be addressed.
Mater. Proc. 2020, 2(1), 12; https://doi.org/10.3390/CIWC2020-06823
Published: 13 May 2020
(This article belongs to the Proceedings of 2nd Coatings and Interfaces Web Conference (CIWC-2 2020))
The determination of thickness has a fundamental importance in all fields in which the implementation of films and coatings are required and takes a crucial role in the electroplating sector. The thickness influences many aspects of the coatings such as electrical, mechanical, corrosion protection, and even aesthetic properties. In the multitude of applications of thin layer coatings, the variability of thicknesses and materials is very high, as well as the variability of possible techniques that can be used to determine the characteristics of the layers of interest. The first distinction that can be made between these techniques is that which divides destructive techniques from non-destructive ones, in which, however, the semi- or micro-destructive techniques are immediately difficult to place. Other important parameters to consider are the cost, both for the purchase of the instrumentation and for each single analysis, the difficulties in preparing and measuring the sample, data processing, and obviously the detectable thickness ranges, the possible measurable materials, and precision and accuracy. The purpose of this work is to compare the characteristics of the various investigation methods, with a particular focus on metal film applications, so that it will be easier to choose the most suitable technique for each purpose.
Keywords: thickness determination; thin film; material characterization; metal coating; cross-section; optical microscopy; SEM; FIB; EDS; XRF thickness determination; thin film; material characterization; metal coating; cross-section; optical microscopy; SEM; FIB; EDS; XRF
MDPI and ACS Style

Giurlani, W.; Berretti, E.; Innocenti, M.; Lavacchi, A. Measuring the Thickness of Metal Films: A Selection Guide to the Most Suitable Technique. Mater. Proc. 2020, 2, 12. https://doi.org/10.3390/CIWC2020-06823

AMA Style

Giurlani W, Berretti E, Innocenti M, Lavacchi A. Measuring the Thickness of Metal Films: A Selection Guide to the Most Suitable Technique. Materials Proceedings. 2020; 2(1):12. https://doi.org/10.3390/CIWC2020-06823

Chicago/Turabian Style

Giurlani, Walter, Enrico Berretti, Massimo Innocenti, and Alessandro Lavacchi. 2020. "Measuring the Thickness of Metal Films: A Selection Guide to the Most Suitable Technique" Materials Proceedings 2, no. 1: 12. https://doi.org/10.3390/CIWC2020-06823

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