- Article
Stitching Interferometry for X-Ray Mirror Metrology at the Hefei Advanced Light Facility (HALF)
- Yanghui Wang,
- Yifan Zhao,
- Huiyun Wang,
- Yiyang Hu,
- Liang He,
- Shuai Zhao and
- Xuewei Du
The advancements in the 4th-generation synchrotron radiation light sources, characterized by their enhanced coherence and brightness, have led to more stringent requirements for the surface quality of X-ray mirrors used in beamlines. This poses a sig...