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Recent Advances in Condition Monitoring and Fault Diagnosis
This special issue belongs to the section “Systems & Control Engineering“.
Special Issue Information
Dear Colleagues,
Condition monitoring and fault diagnosis are essential for ensuring the safety, reliability, and efficiency of modern industrial systems. With the rapid development of sensing technologies, signal processing methods, and intelligent algorithms, data-driven and physics-informed approaches have significantly improved the capability of detecting, diagnosing, and predicting equipment faults under complex operating conditions.
This Special Issue aims to highlight recent advances in theories, methodologies, and practical applications for condition monitoring, anomaly detection, fault diagnosis, and prognostics (e.g., remaining useful life estimation). We welcome innovative research that integrates advanced sensing, efficient algorithms, and real-world validation across diverse industrial scenarios. Contributions that demonstrate robustness, interpretability, and deployability in practical environments are particularly encouraged.
Topics of Interest (non-exhaustive):
- Signal processing and feature extraction for monitoring data;
- Machine learning and deep learning for fault detection and diagnosis;
- Few-shot, one-shot, zero-shot transfer, and self-supervised learning under limited labels;
- Domain adaptation and robustness to noise, drift, and missing data;
- Physics-informed and hybrid modeling approaches;
- Prognostics and health management, including RUL prediction;
- Multisensor fusion and distributed monitoring systems;
- Explainable, reliable, and uncertainty-aware diagnosis methods;
- Benchmarking, datasets, and real-world industrial case studies.
Dr. Cong Peng
Dr. Zisheng Wang
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- fault diagnosis
- fault detection
- PHM
- maintenance
- AI
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