Advances in Electrical Capacitance Tomography
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Computer Science & Engineering".
Deadline for manuscript submissions: closed (28 February 2023) | Viewed by 407
Special Issue Editor
Special Issue Information
Dear Colleagues,
Electrical capacitance tomography (ECT) is widely used in industrial processes to monitor material distribution due to its advantages of non-intrusive measurement, fast imaging speed, and low cost. As a soft-field tomography technique, the spatial resolution of ECT is lower than that of hard-field tomography, such as X-rays. To achieve the ultimate objective of high-accuracy material distribution measurement, a significant volume of research is being conducted by groups around the world, on topics including:
- Sensor design;
- Image reconstruction algorithms;
- Data acquisition systems;
- Data processing methods;
- Electrical capacitance volume tomography (ECVT).
This Special Issue on “Advances in Electrical Capacitance Tomography” brings together state-of-the-art research in these and other topics to traceable high-accuracy ECT and its application. We welcome contributions from researchers working in ECT at all levels of precision. Topics of interest include but are not limited to those described above.
Prof. Dr. Jiamin Ye
Guest Editor
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