2D/3D Industrial Visual Inspection and Intelligent Image Processing
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Industrial Electronics".
Deadline for manuscript submissions: 15 October 2025 | Viewed by 265
Special Issue Editors
Interests: industrial 2D/3D visual inspection; intelligent image processing
Special Issues, Collections and Topics in MDPI journals
Interests: optical 3D measurement; machine vision; online/onsite intelligent sensing
Special Issues, Collections and Topics in MDPI journals
Interests: online visual inspection; robot calibration
Interests: Industry 4.0; intelligent manufacturing system; artificial intelligence
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
In recent years, online and onsite optical metrology techniques have received extensive attention for many dimensional control research and industrial applications. This Special Issue focuses on the advancements and applications of 2D and 3D industrial visual inspection and intelligent image processing technologies. With the increasing demand for automation, precision, and efficiency in industrial settings, visual inspection has become a cornerstone for quality control, defect detection, and dimensional measurement. This issue explores state-of-the-art methods for 2D and 3D measurement, visual inspection, and real-time analysis powered by artificial intelligence, machine learning, and computer vision. Topics include innovative approaches to defect detection, metrology, image processing, along with their integration into smart manufacturing systems.
Additionally, this Special Issue highlights challenges such as handling complex geometries, high-speed measurement, and measurement data processing, as well as solutions leveraging deep learning and hybrid algorithms. Contributions that address emerging trends, such as the fusion of 2D and 3D data, cloud-based inspection systems, and the “Smart +” measurement, are particularly encouraged. This Special Issue aims to provide a platform for researchers and practitioners to share insights and innovations that drive the evolution of industrial visual inspection toward greater intelligence and autonomy.
The technical scope of this Special Issue includes, but is not limited to, the following:
- 2D and 3D optical metrology techniques;
- Intelligent image processing;
- Accuracy and efficiency improvements for optical metrology;
- Vision detection or 3D reconstruction using UAV;
- Robot-integrated optical metrology systems;
- AI-assisted optical metrology;
- Online/onsite optical metrology solutions;
- 2D and 3D AOI;
- Large-scale measurement;
- Point cloud processing;
- Measurement uncertainty;
- 3D endoscopic metrology;
- Event camera-based 3D metrology.
Dr. Xiao Yang
Dr. Xiaobo Chen
Dr. Chengyi Yu
Prof. Dr. Jinsong Bao
Guest Editors
Manuscript Submission Information
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Keywords
- optical metrology
- online/onsite inspection
- image processing
- deep learning
- point cloud processing
- uncertainty analysis
- event camera
- endoscopic metrology
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