Real-Time Fault Detection and Diagnosis of Industrial Electronics Equipment

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Industrial Electronics".

Deadline for manuscript submissions: 31 July 2025 | Viewed by 375

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Guest Editor
School of Electrical Engineering, Southeast University, Nanjing 210096, China
Interests: motor drives; servo control; fault-tolerant control and fault diagnosis of AC machines; electrified transportation
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Special Issue Information

Dear Colleagues,

Electric equipment plays a vital role in many areas including industrial production, transportation and energy supply. During long-term operation, electric equipment suffers from many issues including overvoltage, overcurrent, insulation aging and component wear. These issues can cause faults in electric equipment and degrade its performance and efficiency. In some cases, it may even lead to major safety accidents and huge economic losses. Hence, novel advancements in real-time fault detection and diagnosis of electric equipment requires deeper exploration.

In order to achieve precise and reliable fault detection, signal sampling, signal processing analysis and machine learning technologies are applied to algorithm design. In addition, condition monitoring can also be applied for extremely minor faults.

This Special Issue of Electronics, entitled ‘Real-Time Fault Detection and Diagnosis of Industrial Electronics Equipment’, aims to present the latest research on real-time fault detection and diagnosis for electric equipment, providing a platform for researchers from both academic and industrial fields to showcase their theoretical and technological advancements.

Original research articles and reviews are welcome on topics including (but not limited to) the following research areas:

(1) Techniques for real-time fault diagnosis in electric equipment;

(2) Development of real-time condition monitoring techniques;

(3) Integrated research on advanced fault diagnosis algorithms;

(4) Application of machine learning in fault diagnosis;

(5) Fault feature extraction and processing of sensor signals.

We look forward to receiving your contributions. 

Prof. Dr. Wei Wang
Guest Editor

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Keywords

  • fault detection and diagnosis
  • condition monitoring
  • diagnostic algorithms integration
  • machine learning
  • signal processing

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Published Papers (1 paper)

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Research

13 pages, 3315 KiB  
Article
Impedance Monitoring of Capacitively Coupled Plasma Based on the Vacuum Variable Capacitor Positions of Impedance Matching Unit
by Hwang Gyu Kim, Jiseok Lee and Sang Jeen Hong
Electronics 2025, 14(10), 2022; https://doi.org/10.3390/electronics14102022 - 15 May 2025
Viewed by 159
Abstract
Plasma impedance monitoring in semiconductor manufacturing processes is performed using external sensors, such as voltage-current (VI) probes or directional couplers. Plasma chamber impedance measurements, conducted in non-50 Ω matched transmission lines, suffer from a lack of clean signals due to phase variations and [...] Read more.
Plasma impedance monitoring in semiconductor manufacturing processes is performed using external sensors, such as voltage-current (VI) probes or directional couplers. Plasma chamber impedance measurements, conducted in non-50 Ω matched transmission lines, suffer from a lack of clean signals due to phase variations and the nonlinearity of plasma, thus, sensor calibration is required for each installment. In this study, we monitored plasma impedance in situ based on the position of the vacuum variable capacitor within the matching network, without employing an external VI probe. We observed changes in the matching position according to parameter variations and subsequently confirmed that the calculated plasma impedance also varied accordingly. This study demonstrates the feasibility of real-time plasma impedance monitoring under 50 Ω-matched conditions without the use of external sensors, thereby simplifying plasma diagnostics. Full article
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