Feature Extraction and Data Classification

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Computer Science & Engineering".

Deadline for manuscript submissions: 15 June 2026 | Viewed by 43

Special Issue Editors


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Guest Editor
College of Computer Science and Technology, Jilin University, Changchun 130012, China
Interests: feature engineering; multi-label; multi-view; causal inference
Special Issues, Collections and Topics in MDPI journals

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Guest Editor
School of Computer Science and Technology, Changchun University of Science and Technology, Changchun 130022, China
Interests: image processing; machine learning

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Guest Editor
College of Artificial Intelligence, Southwest University, Chongqing 400715, China
Interests: feature selection methods; classification accuracy; fuzzy set; k-nearest neighbor
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

Focus of this Special Issue

The focus of this Special Issue is on the critical role of feature engineering in the context of data mining. Feature engineering is a crucial step in the data mining pipeline, where raw data is transformed into meaningful features that enhance model performance, interpretability, and generalizability. This Special Issue aims to explore advanced methodologies, novel techniques, and innovative applications of feature engineering in data mining across various domains, including business analytics, healthcare, cybersecurity, and social networks.

Scope of this Special Issue

The scope of this Special Issue includes, but is not limited to:

  • Techniques for feature extraction: New methods for deriving useful features from raw data, especially in complex domains such as time series, image data, and unstructured data.
  • Automated feature engineering: Methods such as autoML and deep learning-based feature engineering that can reduce manual intervention, making data mining tasks more efficient.
  • Feature selection: Innovative approaches to selecting the most relevant features to improve model accuracy, prevent overfitting, and enhance interpretability.
  • Domain-specific feature engineering: Tailored feature engineering techniques designed for specific industries such as healthcare (e.g., bioinformatics), finance (e.g., fraud detection), and environmental data mining.
  • Feature transformation and normalization: The impact of various transformations on the performance of machine learning models, including scaling, discretization, and encoding.
  • Evaluation metrics: How to assess the effectiveness of feature engineering techniques, including performance improvements and computational efficiency.

Purpose of this Special Issue

The primary purpose of this Special Issue is to:

  • Highlight the importance of feature engineering in the data mining process, which is often an overlooked aspect despite its pivotal role in model success.
  • Present cutting-edge research that advances the current understanding of feature engineering methods and how they can be adapted to modern data sets (e.g., big data, multi-modal data).
  • Provide practical insights and guidelines for practitioners in data mining on how to design and select features that enhance the performance of machine learning models.

Promote interdisciplinary approaches: By showcasing research across multiple domains, this issue will encourage cross-domain fertilization of ideas and methods in feature engineering

Dr. Wanfu Gao
Dr. Jun Qin
Dr. Wentao Li
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • feature engineering
  • feature selection
  • multi-view
  • multi-label

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Published Papers

This special issue is now open for submission.
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