Recent Advances in Microwave/Millimeter Wave-Integrated Circuits

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Circuit and Signal Processing".

Deadline for manuscript submissions: 30 June 2025 | Viewed by 519

Special Issue Editors


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Guest Editor
Department of Electrical and Computer Engineering, Microwaves Lab, Democritus University of Thrace, 67100 Xanthi, Greece
Interests: design and implementation of microwave circuits; radar and antenna systems; computational electromagnetic; 5G wireless systems; biomedical applications
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Guest Editor
College of Engineering & Computing, Florida International University, Miami, FL 33174, USA
Interests: theoretical and computational electromagnetics; microwaves; antennas; photonics
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

This Special Issue will include papers on the emerging topic of microwave and millimeter wave-integrated circuits. Microwave and millimeter wave components will play a key role in the development of next-generation communication systems and will enable the development of important future applications that aim to support environments with ubiquitous connectivity. Therefore, such circuits and components must be able to support systems that provide high data rates (in the order of 20 Gbps), high traffic capacities (in the order of 10 Mbps/m2), and extremely low latencies (e.g., 1 ms). The goal of this Special Issue is to provide leading papers in the emerging area of microwave/millimeter wave-integrated circuits. Topics of interest include, but are not limited to, the following:

  • Multi-beam antenna technologies.
  • Microwave and millimeter wave components (e.g., filters, couplers, power dividers, etc.).
  • Reconfigurable radiating apertures (e.g., reflectarrays, transmitarrays, metasurfaces).
  • Beam-forming networks and techniques.
  • Reconfigurable microwave and millimeter wave components.
  • Multi-band microwave and millimeter wave components.
  • Wideband microwave and millimeter wave components.
  • Amplifiers, mixers, and oscillators.
  • Integrated transceivers.
  • On-chip millimeter wave antennas.
  • In-package devices for millimeter wave applications.
  • On-package integrated air interfaces: beam formers and antennas.
  • Optimization techniques for antenna arrays and millimeter wave components.

Prof. Dr. George Kyriacou
Dr. Constantinos L. Zekios
Guest Editors

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Keywords

  • antennas
  • antenna arrays
  • microwave components
  • millimeter wave components
  • beam-forming networks

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Published Papers (1 paper)

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Research

14 pages, 2601 KiB  
Article
A Novel Reformulation of LRRM Calibration Algorithm Using the Pseudo Cascading Relationship
by Wei Zhao, Lingjia Wang and Chunyue Cheng
Electronics 2025, 14(5), 928; https://doi.org/10.3390/electronics14050928 - 26 Feb 2025
Viewed by 307
Abstract
In this paper, by combining the error network mapping model with the pseudo cascading relationship, the line-reflect-reflect-match (LRRM) calibration of a vector network analyzer (VNA) is reformulated in a novel and simple way. Based on the error network mapping model in the hybrid [...] Read more.
In this paper, by combining the error network mapping model with the pseudo cascading relationship, the line-reflect-reflect-match (LRRM) calibration of a vector network analyzer (VNA) is reformulated in a novel and simple way. Based on the error network mapping model in the hybrid parameter representation, the raw measured waves are mapped to the equivalent voltages and currents at the test ports. To describe the mapping relationship, the hybrid parameter matrix is constructed by measurement of the thru standard, and only three calibration coefficients, namely x, y, and z, are required to be solved for the VNA calibration. Meanwhile, when measuring the double one-port standard, the pseudo cascading relationship is defined and used to establish the calibration equation in the form of matrix multiplication. By this means, an eigenvalue problem similar to that in thru-reflect-line (TRL) calibration is derived after a series of simple matrix operations. Solving the eigenvalue problem enables the calibration coefficients x and y to be calculated in a convenient manner. Then, by utilizing the lumped models of partial calibration standards, the last calibration coefficient z is determined. Once all three calibration coefficients are obtained, the LRRM calibration is completed. Finally, on-wafer experiments are performed to verify the formulated LRRM calibration. Full article
(This article belongs to the Special Issue Recent Advances in Microwave/Millimeter Wave-Integrated Circuits)
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