Special Issue "Experimental Mechanics, Instrumentation and Metrology"

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Mechanical Engineering".

Deadline for manuscript submissions: 30 November 2019

Special Issue Editors

Guest Editor
Prof. Dr. Teresa Leonor Martins Morgado

Polytechnic Institute of Tomar (IPT), Av. Dr. Aurélio Ribeiro 3, Tomar, Portugal;
Faculty of Science and Technology, Universidade Nova de Lisboa (UNIDEMI), 1070-312 Lisbon, Portugal;
National Laboratory for Civil Engineering (LNEC), Av. do Brasil 101, 1700-066 Lisboa, Portugal
Website | E-Mail
Interests: instrumentation; mechanical tests; experimental stress; mechanical behaviour of materials; mechanics of fracture; additive manufacturing processes, namely the laser cladding process and foundry processes; processes and maintenance management
Guest Editor
Dr. Álvaro Silva Ribeiro

National Laboratory for Civil Engineering (LNEC), Av. do Brasil 101, 1700-066 Lisboa, Portugal
Website 1 | Website 2 | E-Mail
Interests: metrology; quality systems; numerical simulation; applied mathematics; modelling; testing; accreditation
Guest Editor
Dr. Luís Filipe Lages Martins

National Laboratory for Civil Engineering (LNEC), Av. do Brasil 101, 1700-066 Lisboa, Portugal
Website | E-Mail
Interests: metrology; quality; instrumentation; optics

Special Issue Information

Dear Colleagues,

Experimental Mechanics, Instrumentation and Metrology is a highly multidisciplinary research field. It combines technological and scientific methods to produce, model, and understand physical phenomena. Submissions are invited for both original research and review articles. Additionally, invited papers based on excellent contributions to the recent Flomeko 2019 conference in this field will be included in this Special Issue. We hope that this collection of papers will serve as an inspiration for those interested in Experimental Mechanics, Instrumentation and Metrology.

Following the end of the Flomeko 2019 conference, the Scientific Committee will select a number of papers, based on their scientific originality and on the relevance of their topics, for publication in this Special Issue. Theoretical and experimental contributions, original and review studies, and industrial and university research will be welcome. The selected authors will then be invited to submit extended versions of their conference paper. The main topics include, but are not limited to the following:

Prototyping and full-scale testing; NEMS and MEMS technologies; Instrumentation; data acquisition and processing; metrology; monitoring; experimental tests; measurements; optimum experimental techniques; study cases.

Prof. Dr. Teresa Leonor Martins Morgado
Dr. Álvaro Silva Ribeiro
Dr. Luís Filipe Lages Martins
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1500 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Instrumentation 
  • Metrology
  • Measurements
  • Flowmeter
  • NEMS
  • MEMS
  • Monitoring
  • Data acquisition
  • Experimental techniques
  • Data processing
  • Reliability
  • Monte Carlo method
  • Uncertainty
  • Calibration
  • Test bench
  • Full-scale testing
  • Prototyping testing

Published Papers

This special issue is now open for submission.
Appl. Sci. EISSN 2076-3417 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
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