- Article
Curved-Mechanical Characteristic Measurements of Transparent Conductive Film-Coated Polymer Substrates Using Common-Path Optical Interferometry
- Bor-Jiunn Wen and
- Jui-Jen Hsu
This study proposes a method for measuring curved-mechanical characteristics based on a whole-folding test for transparent conductive film-coated polymer substrates using common-path optical interferometry. Accordingly, 80-, 160-, and 230-nm indium t...