Spectroscopy and Microscopy Study of Nanomaterials

A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Synthesis, Interfaces and Nanostructures".

Deadline for manuscript submissions: closed (27 June 2025) | Viewed by 319

Special Issue Editors


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Guest Editor
CNR—Istituto Officina dei Materiali (IOM), Trieste, Italy
Interests: condensed matter physics; surface science; 2D materials; nanomaterials; scanning probe microscopy and spectroscopy

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Guest Editor
Physics Department “E.R. Caianiello”, University of Salerno, Salerno, Italy
Interests: condensed matter physics; surface science; 2D materials; nanomaterials; scanning probe microscopy and spectroscopy

Special Issue Information

Dear Colleagues,

Nanomaterials are widely regarded as promising components for high-performance, innovative, and application-specific devices in various fields, including electronics, healthcare, energy, and environmental technologies, due to their enhanced conductivity, strength, reactivity, and optical properties. Their nanoscale dimensions impart unique physical, chemical, and biological characteristics that differ from those of their bulk counterparts. These distinct properties, such as enhanced reactivity, altered electron behavior, and modified surface energies, arise from their high surface area to volume ratio, quantum effects, and the influence of nanostructuring on molecular and atomic-level interactions.

Microscopy and spectroscopy methods are essential tools for nanoscience research and applications, providing detailed and complementary insights into the structure, composition, and properties of materials at the nanoscale.

This Special Issue aims to present a cutting-edge collection of research studies highlighting recent advances in the study of nanomaterials through microscopy and spectroscopy techniques. We invite submissions and welcome original research papers and review articles that show current progress in these fields, explore new methodologies, unveil novel nanostructures, and provide deep insights into (new) materials, with a focus on advancing our understanding through microscopy and spectroscopy.

Potential topics include, but are not limited to, Van der Waals layered materials, nanoparticles, nanotubes, nanowires, nanofilms, and quantum dots. The investigation of these materials may involve scanning probe microscopies (such as scanning tunneling microscopy, atomic force microscopy, and related techniques), electron microscopies (including scanning electron microscopy and transmission electron microscopy), and spectroscopies (such as Raman, infrared, UV-Vis, and X-ray spectroscopies, and second harmonic generation). In this Special Issue, we aim to advance the current understanding of nanomaterials and inspire new ideas for future applications and technologies.

We look forward to your valuable contributions.

Dr. Cinzia Di Giorgio
Dr. Fabrizio Bobba
Guest Editors

Manuscript Submission Information

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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Nanomaterials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • nanomaterials
  • nanostructures
  • 2D materials
  • microscopy
  • spectroscopy

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Published Papers (1 paper)

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Research

15 pages, 2579 KiB  
Article
Photo-Scanning Capacitance Microscopy and Spectroscopy Study of Epitaxial GaAsN Layers and GaAsN P-I-N Solar Cell Structures
by Adam Szyszka, Wojciech Dawidowski, Damian Radziewicz and Beata Ściana
Nanomaterials 2025, 15(14), 1066; https://doi.org/10.3390/nano15141066 - 9 Jul 2025
Viewed by 77
Abstract
This work presents a novel approach to investigating epitaxial GaAsN layers and GaAsN-based p-i-n solar cell structures using light-assisted scanning capacitance microscopy (SCM) and spectroscopy. Due to the technological challenges in growing high-quality GaAsN with controlled nitrogen incorporation, the epitaxial layers often exhibit [...] Read more.
This work presents a novel approach to investigating epitaxial GaAsN layers and GaAsN-based p-i-n solar cell structures using light-assisted scanning capacitance microscopy (SCM) and spectroscopy. Due to the technological challenges in growing high-quality GaAsN with controlled nitrogen incorporation, the epitaxial layers often exhibit inhomogeneity in their opto-electrical properties. By combining localized cross-section SCM measurements with wavelength-tunable optical excitation (800–1600 nm), we resolved carrier concentration profiles, internal electric fields, and deep-level transitions across the device structure at a nanoscale resolution. A comparative analysis between electrochemical capacitance–voltage (EC-V) profiling and photoluminescence spectroscopy confirmed multiple localized transitions, attributed to compositional fluctuations and nitrogen-induced defects within GaAsN. The SCM method revealed spatial variations in energy states, including discrete nitrogen-rich regions and gradual variations in the nitrogen content throughout the layer depth, which are not recognizable using standard characterization methods. Our results demonstrate the unique capability of the photo-scanning capacitance microscopy and spectroscopy technique to provide spatially resolved insights into complex dilute nitride structures, offering a universal and accessible tool for semiconductor structures and optoelectronic devices evaluation. Full article
(This article belongs to the Special Issue Spectroscopy and Microscopy Study of Nanomaterials)
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